Inventor · disambiguated record
Raymond J. Beffa
Also filed as: BEFFA RAYMOND J
56 granted patents·3 pending applications·1,820 citations·filing 1996–2011
99Inventor score
Top patents by PatentIndex Score
59 records- 0196US6324088B1256 meg dynamic random access memoryMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 27, 2001·72 cites·67 claims
- 0295US6594611B2Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufactureMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 15, 2003·57 cites·20 claims
- 0395US5915231AMethod in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufactureMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 22, 1999·116 cites·23 claims
- 0494US6636068B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 21, 2003·40 cites·15 claims
- 0594US6529793B1Method of sorting a group of integrated circuit devices for those devices requiring special testingMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 4, 2003·57 cites·32 claims
- 0694US6424168B1Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 23, 2002·45 cites·11 claims
- 0794US6208947B1Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufactureMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 27, 2001·53 cites·23 claims
- 0894US5844803AMethod of sorting a group of integrated circuit devices for those devices requiring special testingMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 1, 1998·114 cites·33 claims
- 0993US6534785B1Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 18, 2003·42 cites·3 claims
- 1093US6373011B1Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 16, 2002·49 cites·1 claims
- 1193US5927512AMethod for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 27, 1999·107 cites·1 claims
- 1292US7124050B2Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufactureMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 17, 2006·12 cites·19 claims
- 1392US6504123B2Process for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 7, 2003·41 cites·2 claims
- 1492US6452415B1Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 17, 2002·29 cites·15 claims
- 1592US6365861B1Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·43 cites·1 claims
- 1692US6363329B2Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufactureMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 26, 2002·40 cites·20 claims
- 1792US6350959B1Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 26, 2002·42 cites·2 claims
- 1891US7567091B2Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2008·Granted Jul 28, 2009·11 cites·4 claims
- 1991US6365860B1Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·38 cites·2 claims
- 2091US6313658B1Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor waferMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 6, 2001·48 cites·17 claims
- 2191US5898186AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1996·Granted Apr 27, 1999·71 cites·36 claims
- 2290US8189423B2256 Meg dynamic random access memoryKEETH BRENT·Filed 2011·Granted May 29, 2012·5 cites·14 claims
- 2390US6788993B2Sorting a group of integrated circuit devices for those devices requiring special testingMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 7, 2004·33 cites·25 claims
- 2490US6292009B1Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 18, 2001·58 cites·11 claims
- 2590US5994915AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 30, 1999·68 cites·8 claims
- 2689US7117063B2Sorting a group of integrated circuit devices for those devices requiring special testingMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 3, 2006·9 cites·18 claims
- 2789US6703573B2Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 9, 2004·32 cites·2 claims
- 2889US6437271B1Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 20, 2002·37 cites·2 claims
- 2989US6100486AMethod for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 8, 2000·58 cites·3 claims
- 3088US7502659B2Sorting a group of integrated circuit devices for those devices requiring special testingMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 10, 2009·8 cites·34 claims
- 3188US7477557B2256 Meg dynamic random access memoryMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 13, 2009·7 cites·13 claims
- 3288US6067507AMethod in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processd during their manufactureMICRON TECHNOLOGY INC·Filed 1999·Granted May 23, 2000·56 cites·23 claims
- 3387US6307171B1Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 23, 2001·30 cites·2 claims
- 3487US6147316AMethod for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 14, 2000·60 cites·2 claims
- 3586US6944567B2Method in an integrated circuit (IC) manufacturing process for identifying and redirecting ICs mis-processed during their manufactureMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 13, 2005·22 cites·19 claims
- 3686US6122563AMethod of sorting a group of integrated circuit devices for those devices requiring special testingMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 19, 2000·49 cites·32 claims
- 3786US6118138AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 12, 2000·46 cites·3 claims
- 3884US7276926B2Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 2, 2007·6 cites·20 claims
- 3983US7489564B2256 Meg dynamic random access memoryMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 10, 2009·4 cites·11 claims
- 4083US6831475B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 14, 2004·14 cites·13 claims
- 4181US7276672B2Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 2, 2007·6 cites·3 claims
- 4278US6852999B2Reduced terminal testing systemMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 8, 2005·11 cites·3 claims
- 4378US5976899AReduced terminal testing systemMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 2, 1999·31 cites·1 claims
- 4477US7276927B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 2, 2007·4 cites·15 claims
- 4576US7107117B2Sorting a group of integrated circuit devices for those devices requiring special testingMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 12, 2006·11 cites·28 claims
- 4675US7034561B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 25, 2006·9 cites·13 claims
- 4774US7323896B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 29, 2008·3 cites·16 claims
- 4874US7212020B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted May 1, 2007·3 cites·4 claims
- 4973US7315179B2System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 1, 2008·3 cites·14 claims
- 5066US7682847B2Method for sorting integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2008·Granted Mar 23, 2010·1 cites·20 claims
Showing the top 50 of 59 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →