Inventor · disambiguated record
Rafael Bistritzer
Also filed as: BISTRITZER RAFAEL
12 granted patents·8 pending applications·1 citations·filing 2020–2025
80Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD20
Top patents by PatentIndex Score
20 records- 0176US12277750B2Identification of an array in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Apr 15, 2025·0 cites·18 claims
- 0275US12361526B2Reconstruction of a distorted image of an array of structural elements of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Jul 15, 2025·0 cites·20 claims
- 0371US11321835B2Determining three dimensional informationAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted May 3, 2022·1 cites·19 claims
- 0471US2025209788A1Identification of an array in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2025·Application pending·0 cites
- 0570US12299868B2Control of a manufacturing process using contour curvature analysis of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted May 13, 2025·0 cites·20 claims
- 0669US2025225642A1Stabilization of a manufacturing process of a specimen by shape analysis of structural elements of the specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2025·Application pending·0 cites
- 0766US11645831B2Identification of an array in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted May 9, 2023·0 cites·18 claims
- 0863US11798138B2Reconstruction of a distorted image of an array of structural elements of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Oct 24, 2023·0 cites·17 claims
- 0952US12347734B2Examination of a hole formed in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Jul 1, 2025·0 cites·21 claims
- 1052US2025004386A1Machine learning based metrology for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1151US2025225646A1Systems and methods for registration between images informative of one or more semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1251US2024428395A1Optimization of a metrology algorithm for examination of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1351US2025265697A1Registration between an inspection image and a design imageAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 1448US2025183001A1Calibration of an examination systemAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1547US11686571B2Local shape deviation in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
- 1646US2025045904A1Image segmentation for examining a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1744US12272042B2Detection of defects using a computationally efficient segmentation approachAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Apr 8, 2025·0 cites·20 claims
- 1844US11921063B2Lateral recess measurement in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 1944US11443420B2Generating a metrology recipe usable for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Sep 13, 2022·0 cites·20 claims
- 2039US11953316B2Geometry based three dimensional reconstruction of a semiconductor specimen by solving an optimization problem, using at least two SEM images acquired at different illumination anglesAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 9, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →