Inventor · disambiguated record
Ran Goldman
Also filed as: GOLDMAN RAN
4 granted patents·19 citations·filing 2015–2018
71Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD4
Top patents by PatentIndex Score
4 records- 0194US9530199B1Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Dec 27, 2016·12 cites·15 claims
- 0292US10354376B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Jul 16, 2019·5 cites·20 claims
- 0383US9916652B2Technique for measuring overlay between layers of a multilayer structureAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Mar 13, 2018·2 cites·20 claims
- 0436US9824852B2CD-SEM technique for wafers fabrication controlAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Nov 21, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →