Inventor · disambiguated record
Randolph E. Griffith
Also filed as: GRIFFITH RANDOLPH E
2 granted patents·1 pending application·7 citations·filing 2018–2019
53Inventor score
Files withNANOTRONICS IMAGING INC3
Top patents by PatentIndex Score
3 records- 0186US10254214B1Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2018·Granted Apr 9, 2019·6 cites·12 claims
- 0270US11125677B2Systems, devices, and methods for combined wafer and photomask inspectionNANOTRONICS IMAGING INC·Filed 2019·Granted Sep 21, 2021·1 cites·12 claims
- 0341US2019242790A1Methods and Apparatuses for Cutting Specimens for Microscopic ExaminationNANOTRONICS IMAGING INC·Filed 2018·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Randolph E. Griffith files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →