Inventor · disambiguated record
Rajesh Kamana
Also filed as: KAMANA RAJESH
6 granted patents·2 pending applications·7 citations·filing 2010–2022
73Inventor score
Top patents by PatentIndex Score
8 records- 0178US10672500B2Non-contact measurement of memory cell threshold voltageMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 2, 2020·2 cites·20 claims
- 0276US10650891B2Non-contact electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2019·Granted May 12, 2020·3 cites·17 claims
- 0369US10403359B2Non-contact electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 3, 2019·2 cites·5 claims
- 0466US11636911B2Leakage source detection for memory with varying conductive path lengthsMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 25, 2023·0 cites·20 claims
- 0558US11081203B2Leakage source detection by scanning access linesMICRON TECHNOLOGY INC·Filed 2019·Granted Aug 3, 2021·0 cites·19 claims
- 0655US10381101B2Non-contact measurement of memory cell threshold voltageMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 13, 2019·0 cites·3 claims
- 0750US2023298951A1Test structures for a wafer, and associated devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2022·Application pending·0 cites
- 0832US2012007073A1Semiconductor Wafer Constructions, And Methods For Quality Testing Material Removal Procedures During Semiconductor Fabrication ProcessesMEHTA ANJUM·Filed 2010·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Rajesh Kamana files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →