Inventor · disambiguated record
Rainer Kraus
Also filed as: KRAUS RAINER · KRAUS RAINER DR
14 granted patents·601 citations·filing 1987–1995
93Inventor score
Top patents by PatentIndex Score
14 records- 0198US5276643AIntegrated semiconductor circuitSIEMENS AG·Filed 1991·Granted Jan 4, 1994·422 cites·17 claims
- 0277US5229710ACmos band gap reference circuitSIEMENS AG·Filed 1991·Granted Jul 20, 1993·31 cites·9 claims
- 0374US5184326AIntegrated semiconductor memory of the dram type and method for testing the sameSIEMENS AG·Filed 1990·Granted Feb 2, 1993·36 cites·28 claims
- 0471US4956819ACircuit configuration and a method of testing storage cellsSIEMENS AG·Filed 1988·Granted Sep 11, 1990·19 cites·9 claims
- 0564US4922134ATestable redundancy decoder of an integrated semiconductor memorySIEMENS AG·Filed 1989·Granted May 1, 1990·20 cites·8 claims
- 0660US4906994AMulti-stage integrated decoder deviceSIEMENS AKTIENGELSELLSCHAFT·Filed 1988·Granted Mar 6, 1990·18 cites·7 claims
- 0752US4885748AMethod and circuit configuration of the parallel input of data into a semiconductor memorySIEMENS AG·Filed 1988·Granted Dec 5, 1989·13 cites·13 claims
- 0851US4855621AMulti-stage, integrated decoder device having redundancy test enableSIEMENS AG·Filed 1988·Granted Aug 8, 1989·12 cites·6 claims
- 0946US4803386ADigital amplifier configuration in integrated circuitsSIEMENS AG·Filed 1987·Granted Feb 7, 1989·9 cites·3 claims
- 1043US4896322ACircuit configuration and a method for the testing of storage cellsSIEMENS AG·Filed 1988·Granted Jan 23, 1990·8 cites·12 claims
- 1141US5030861AGate circuit having MOS transistorsSIEMENS AG·Filed 1988·Granted Jul 9, 1991·7 cites·13 claims
- 1233US5253209AIntegrated semiconductor memorySIEMENS AG·Filed 1991·Granted Oct 12, 1993·4 cites·13 claims
- 1331US4841180AIntegrable evaluating circuitSIEMENS AG·Filed 1987·Granted Jun 20, 1989·2 cites·11 claims
- 1429USRE36061EIntegrated semiconductor memorySIEMENS AG·Filed 1995·Granted Jan 26, 1999·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →