Inventor · disambiguated record
Rainer Kueng
Also filed as: KUENG RAINER
2 granted patents·1 citations·filing 2015–2017
31Inventor score
Files withOMICRON ELECTRONICS GMBH2
Top patents by PatentIndex Score
2 records- 0162US10605867B2Test arrangement and method for testing a switching systemOMICRON ELECTRONICS GMBH·Filed 2015·Granted Mar 31, 2020·1 cites·14 claims
- 0247US10809299B2Testing device and method for testing a control unit of a switching device of a switchgear installationOMICRON ELECTRONICS GMBH·Filed 2017·Granted Oct 20, 2020·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →