Inventor · disambiguated record
Raymond T. Lee
Also filed as: LEE RAYMOND · LEE RAYMOND T · LEE RAYMOND TAKLING
22 granted patents·605 citations·filing 1994–2001
97Inventor score
Top patents by PatentIndex Score
22 records- 0192US5654589ALanding pad technology doubled up as local interconnect and borderless contact for deep sub-half micrometer IC applicationADVANCED MICRO DEVICES INC·Filed 1995·Granted Aug 5, 1997·96 cites·13 claims
- 0288US5674781ALanding pad technology doubled up as a local interconnect and borderless contact for deep sub-half micrometer IC applicationADVANCED MICRO DEVICES INC·Filed 1996·Granted Oct 7, 1997·69 cites·15 claims
- 0387US6479350B1Reduced masking step CMOS transistor formation using removable amorphous silicon sidewall spacersADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 12, 2002·46 cites·18 claims
- 0484US6287904B1Two step mask process to eliminate gate end cap shorteningADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 11, 2001·34 cites·9 claims
- 0572US5879980AMethod of making static random access memory cell having a trench field plate for increased capacitanceADVANCED MICRO DEVICES INC·Filed 1997·Granted Mar 9, 1999·28 cites·20 claims
- 0671US5627110AMethod for eliminating window mask process in the fabrication of a semiconductor wafer when chemical-mechanical polish planarization is usedADVANCED MICRO DEVICES INC·Filed 1994·Granted May 6, 1997·47 cites·28 claims
- 0770US6287953B1Minimizing transistor size in integrated circuitsADVANCED MICRO DEVICES INC·Filed 2000·Granted Sep 11, 2001·12 cites·22 claims
- 0868US7026691B1Minimizing transistor size in integrated circuitsADVANCED MICRO DEVICES INC·Filed 2001·Granted Apr 11, 2006·10 cites·20 claims
- 0967US6218224B1Nitride disposable spacer to reduce mask count in CMOS transistor formationADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 17, 2001·26 cites·19 claims
- 1067US6103563ANitride disposable spacer to reduce mask count in CMOS transistor formationADVANCED MICRO DEVICES INC·Filed 1999·Granted Aug 15, 2000·27 cites·17 claims
- 1166US6114235AMultipurpose cap layer dielectricADVANCED MICRO DEVICES INC·Filed 1997·Granted Sep 5, 2000·32 cites·6 claims
- 1266US5796651AMemory device using a reduced word line voltage during read operations and a method of accessing such a memory deviceADVANCED MICRO DEVICES INC·Filed 1997·Granted Aug 18, 1998·25 cites·20 claims
- 1365US6051881AForming local interconnects in integrated circuitsADVANCED MICRO DEVICES INC·Filed 1997·Granted Apr 18, 2000·32 cites·9 claims
- 1462US5582881AProcess for deposition of a Ti/TiN cap layer on aluminum metallization and apparatusADVANCED MICRO DEVICES INC·Filed 1996·Granted Dec 10, 1996·24 cites·11 claims
- 1557US5844836AMemory cell having increased capacitance via a local interconnect to gate capacitor and a method for making such a cellADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 1, 1998·17 cites·20 claims
- 1653US6146954AMinimizing transistor size in integrated circuitsADVANCED MICRO DEVICES INC·Filed 1998·Granted Nov 14, 2000·18 cites·20 claims
- 1753US6046088AMethod for self-aligning polysilicon gates with field isolation and the resultant structureADVANCED MICRO DEVICES INC·Filed 1997·Granted Apr 4, 2000·19 cites·10 claims
- 1851US6166428AFormation of a barrier layer for tungsten damascene interconnects by nitrogen implantation of amorphous silicon or polysiliconADVANCED MICRO DEVICES INC·Filed 1997·Granted Dec 26, 2000·16 cites·12 claims
- 1943US6214655B1Amorphous silicon disposable spacer to reduce mask count in CMOS transistor formationADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 10, 2001·8 cites·17 claims
- 2040US6221706B1Aluminum disposable spacer to reduce mask count in CMOS transistor formationADVANCED MICRO DEVICES INC·Filed 1999·Granted Apr 24, 2001·6 cites·13 claims
- 2139US6191034B1Forming minimal size spaces in integrated circuit conductive linesADVANCED MICRO DEVICES INC·Filed 1999·Granted Feb 20, 2001·7 cites·12 claims
- 2237US5930659AForming minimal size spaces in integrated circuit conductive linesADVANCED MICRODEVICES INC·Filed 1997·Granted Jul 27, 1999·6 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →