Inventor · disambiguated record
Rajesh Mittal
Also filed as: MITTAL RAJESH · MITTAL RAJESH KUMAR
22 granted patents·102 citations·filing 2011–2022
94Inventor score
Top patents by PatentIndex Score
22 records- 0194US10832668B1Dynamic speech processingAMAZON TECH INC·Filed 2017·Granted Nov 10, 2020·28 cites·20 claims
- 0294US10060979B2Generating multiple pseudo static control signals using on-chip JTAG state machineTEXAS INSTRUMENTS INC·Filed 2016·Granted Aug 28, 2018·6 cites·20 claims
- 0393US9791505B1Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2016·Granted Oct 17, 2017·5 cites·12 claims
- 0492US10515637B1Dynamic speech processingAMAZON TECH INC·Filed 2017·Granted Dec 24, 2019·19 cites·20 claims
- 0592US9772376B1Increase data transfer throughput by enabling dynamic JTAG test mode entry and sharing of all JTAG pinsTEXAS INSTRUMENTS INC·Filed 2016·Granted Sep 26, 2017·6 cites·20 claims
- 0691US11408936B2Generating multiple pseudo static control signals using on-chip JTAG state machineTEXAS INSTRUMENTS INC·Filed 2020·Granted Aug 9, 2022·2 cites·15 claims
- 0790US10088525B2Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputsTEXAS INSTRUMENTS INC·Filed 2016·Granted Oct 2, 2018·4 cites·24 claims
- 0888US10739402B2Generating multiple pseudo static control signals using on-chip JTAG state machineTEXAS INSTRUMENTS INC·Filed 2018·Granted Aug 11, 2020·2 cites·15 claims
- 0988US9535123B2Frequency scaled segmented scan chain for integrated circuitsTEXAS INSTRUMENTS INC·Filed 2015·Granted Jan 3, 2017·4 cites·12 claims
- 1088US8694276B2Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structureSONTAKKE ADESH SHARADRAO·Filed 2011·Granted Apr 8, 2014·15 cites·16 claims
- 1182US10983161B2Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2019·Granted Apr 20, 2021·1 cites·17 claims
- 1279US11899063B2Generating multiple pseudo static control signals using on-chip JTAG state machineTEXAS INSTRUMENTS INC·Filed 2022·Granted Feb 13, 2024·0 cites·20 claims
- 1374US11821945B2Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2021·Granted Nov 21, 2023·0 cites·24 claims
- 1473US8972807B2Integrated circuits capable of generating test mode control signals for scan testsMITTAL RAJESH·Filed 2012·Granted Mar 3, 2015·4 cites·20 claims
- 1571US9581645B2Test circuit providing different levels of concurrency among radio coresTEXAS INSTRUMENTS INC·Filed 2014·Granted Feb 28, 2017·2 cites·16 claims
- 1670US9261560B2Handling slower scan outputs at optimal frequencyTEXAS INSTRUMENTS INC·Filed 2013·Granted Feb 16, 2016·2 cites·20 claims
- 1764US10877093B2Non-interleaved scan operation for achieving higher scan throughput in presence of slower scan outputsTEXAS INSTRUMENTS INC·Filed 2018·Granted Dec 29, 2020·0 cites·18 claims
- 1864US9239360B2DFT approach to enable faster scan chain diagnosisTEXAS INSTRUMENTS INC·Filed 2014·Granted Jan 19, 2016·2 cites·20 claims
- 1962US10274538B2Full pad coverage boundary scanTEXAS INSTRUMENTS INC·Filed 2017·Granted Apr 30, 2019·0 cites·24 claims
- 2059US9970987B2Method and apparatus for test time reduction using fractional data packingTEXAS INSTRUMENTS INC·Filed 2016·Granted May 15, 2018·0 cites·5 claims
- 2156US9448284B2Method and apparatus for test time reduction using fractional data packingTEXAS INSTRUMENTS INC·Filed 2014·Granted Sep 20, 2016·0 cites·14 claims
- 2240US9347991B1Scan throughput enhancement in scan testing of a device-under-testTEXAS INSTRUMENTS INC·Filed 2014·Granted May 24, 2016·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →