Inventor · disambiguated record

Rajay R. Pai

Also filed as: PAI RAJAY R

1 granted patent·105 citations·filing 1999–1999

53Inventor score

Technology areasG01R

Files withINTEL CORP1

Top patents by PatentIndex Score

1 record

0190US6477674B1Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elementsINTEL CORP·Filed 1999·Granted Nov 5, 2002·105 cites·37 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →