Inventor · disambiguated record
Ralph Schaeffer
Also filed as: SCHAEFFER JR RALPH H · SCHAEFFER RALPH · SCHAEFFER RALPH H
7 granted patents·103 citations·filing 1998–2005
84Inventor score
Files withMICRON TECHNOLOGY INC7
Top patents by PatentIndex Score
7 records- 0194US6924653B2Selectively configurable microelectronic probesMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 2, 2005·71 cites·42 claims
- 0281US7170304B2Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 30, 2007·8 cites·12 claims
- 0353US6446021B1Method and apparatus to display processing parameterMICRON TECHNOLOGY INC·Filed 1998·Granted Sep 3, 2002·20 cites·22 claims
- 0449US7268574B2Systems and methods for sensing obstructions associated with electrical testing of microfeature workpiecesMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 11, 2007·1 cites·54 claims
- 0547US6952109B2Selectively configurable probe structures, e.g., for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 4, 2005·2 cites·21 claims
- 0642US7145355B2Selectively configurable probe structures, e.g., for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 5, 2006·0 cites·9 claims
- 0742US6972580B2Selectively configurable probe structures, e.g., for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 6, 2005·1 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →