Inventor · disambiguated record
Randy J. Simmons
Also filed as: SIMMONS RANDY J
10 granted patents·202 citations·filing 2002–2018
90Inventor score
Files withXILINX INC10
Top patents by PatentIndex Score
10 records- 0193US6889368B1Method and apparatus for localizing faults within a programmable logic deviceXILINX INC·Filed 2002·Granted May 3, 2005·69 cites·16 claims
- 0288US7124338B1Methods of testing interconnect lines in programmable logic devices using partial reconfigurationXILINX INC·Filed 2003·Granted Oct 17, 2006·57 cites·46 claims
- 0379US7262623B1Method for gross I/O functional test at wafer sortXILINX INC·Filed 2003·Granted Aug 28, 2007·19 cites·26 claims
- 0476US10761137B1Flexible manufacturing flow enabled by adaptive binning systemXILINX INC·Filed 2018·Granted Sep 1, 2020·2 cites·20 claims
- 0575US7583102B1Testing of input/output devices of an integrated circuitXILINX INC·Filed 2006·Granted Sep 1, 2009·8 cites·20 claims
- 0670US6943581B1Test methodology for direct interconnect with multiple fan-outsXILINX INC·Filed 2003·Granted Sep 13, 2005·17 cites·38 claims
- 0770US6788095B1Method for gross input leakage functional test at wafer sortXILINX INC·Filed 2003·Granted Sep 7, 2004·12 cites·17 claims
- 0867US6944809B2Methods of resource optimization in programmable logic devices to reduce test timeXILINX INC·Filed 2002·Granted Sep 13, 2005·13 cites·19 claims
- 0962US7558995B1Method and apparatus for eliminating noise induced errors during test of a programmable logic deviceXILINX INC·Filed 2005·Granted Jul 7, 2009·4 cites·5 claims
- 1044US8030954B1Internal voltage level shifting for screening cold or hot temperature defects using room temperature testingXILINX INC·Filed 2009·Granted Oct 4, 2011·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →