Inventor · disambiguated record
Rainer Spehr
Also filed as: SPEHR RAINER
6 granted patents·107 citations·filing 1985–1997
84Inventor score
Technology areasH01J
Files withSIEMENS AG2ACT ADVANCED CIRCUIT TESTING1INTEGRATED CIRCUIT TESTING1STANDARD ELEKTRIK LORENZ AG1
Top patents by PatentIndex Score
6 records- 0190US4713543AScanning particle microscopeSIEMENS AG·Filed 1985·Granted Dec 15, 1987·47 cites·23 claims
- 0280US4675524AScanning particle microscope with diminished boersch effectSIEMENS AG·Filed 1986·Granted Jun 23, 1987·27 cites·20 claims
- 0352US5061856ACorpuscular beam deviceINTEGRATED CIRCUIT TESTING·Filed 1990·Granted Oct 29, 1991·10 cites·10 claims
- 0449US6414319B1Electron optical lens system with a slot-shaped aperture cross sectionFiled 1997·Granted Jul 2, 2002·10 cites·17 claims
- 0546US5808309AApparatus for generating an electron beamACT ADVANCED CIRCUIT TESTING·Filed 1997·Granted Sep 15, 1998·7 cites·12 claims
- 0645US4794306AFlat picture-reproducing deviceSTANDARD ELEKTRIK LORENZ AG·Filed 1986·Granted Dec 27, 1988·6 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →