Inventor · disambiguated record
Raffaele Vallauri
Also filed as: VALLAURI RAFFAELE · VALLAURI RAFFAELE UBALDO
11 granted patents·4 pending applications·9 citations·filing 2015–2021
81Inventor score
Files withTECHNOPROBE SPA15
Top patents by PatentIndex Score
15 records- 0184US10386388B2Contact probe and corresponding testing headTECHNOPROBE SPA·Filed 2017·Granted Aug 20, 2019·4 cites·30 claims
- 0282US10551433B2Testing head comprising vertical probesTECHNOPROBE SPA·Filed 2017·Granted Feb 4, 2020·4 cites·41 claims
- 0370US11442080B2Contact probe and relative probe head of an apparatus for testing electronic devicesTECHNOPROBE SPA·Filed 2021·Granted Sep 13, 2022·0 cites·20 claims
- 0464US11016122B2Contact probe and relative probe head of an apparatus for testing electronic devicesTECHNOPROBE SPA·Filed 2019·Granted May 25, 2021·0 cites·23 claims
- 0558US10228392B2Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Granted Mar 12, 2019·1 cites·36 claims
- 0653US2017269125A1Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Application pending·0 cites
- 0751US10401387B2Manufacturing method of contact probes for a testing headTECHNOPROBE SPA·Filed 2017·Granted Sep 3, 2019·0 cites·28 claims
- 0849US12044703B2Contact probe for high-frequency applications with improved current capacityTECHNOPROBE SPA·Filed 2020·Granted Jul 23, 2024·0 cites·14 claims
- 0949US11029337B2Vertical probe testing head with improved frequency propertiesTECHNOPROBE SPA·Filed 2019·Granted Jun 8, 2021·0 cites·28 claims
- 1047US2024012027A1Probe head with an improved contact between contact probes and metallized guide holesTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 1144US12019111B2Manufacturing method of a multi-layer for a probe cardTECHNOPROBE SPA·Filed 2019·Granted Jun 25, 2024·0 cites·20 claims
- 1242US10509056B2Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applicationsTECHNOPROBE SPA·Filed 2016·Granted Dec 17, 2019·0 cites·21 claims
- 1340US9829508B2Testing head of electronic devicesTECHNOPROBE SPA·Filed 2015·Granted Nov 28, 2017·0 cites·24 claims
- 1439US2017122980A1Contact probe for a testing head and corresponding manufacturing methodTECHNOPROBE SPA·Filed 2017·Application pending·0 cites
- 1532US2017122983A1Testing head comprising vertical probesTECHNOPROBE SPA·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →