Inventor · disambiguated record
Richard W. Arnold
Also filed as: ARNOLD JR RICHARD W · ARNOLD RICHARD · ARNOLD RICHARD W · ARNOLD RICHARD WILLSON
22 granted patents·7 pending applications·577 citations·filing 1995–2015
96Inventor score
Top patents by PatentIndex Score
29 records- 0198US7026833B2Multiple-chip probe and universal tester contact assemblageTEXAS INSTRUMENTS INC·Filed 2005·Granted Apr 11, 2006·123 cites·4 claims
- 0293US6906539B2High density, area array probe card apparatusTEXAS INSTRUMENTS INC·Filed 2001·Granted Jun 14, 2005·63 cites·18 claims
- 0391US6970005B2Multiple-chip probe and universal tester contact assemblageTEXAS INSTRUMENTS INC·Filed 2001·Granted Nov 29, 2005·47 cites·17 claims
- 0485US7181457B2System and method for utilizing compression in database caches to facilitate access to database informationPERVASIVE SOFTWARE INC·Filed 2003·Granted Feb 20, 2007·60 cites·17 claims
- 0581US5647763AMulti-media cross connect systemSUPERIOR MODULAR PROD INC·Filed 1996·Granted Jul 15, 1997·78 cites·14 claims
- 0676US6720574B2Method of testing a semiconductor chipTEXAS INSTRUMENTS INC·Filed 2001·Granted Apr 13, 2004·23 cites·20 claims
- 0774US6996584B2System and method of maintaining functional client side data cache coherencePERVASIVE SOFTWARE INC·Filed 2002·Granted Feb 7, 2006·40 cites·24 claims
- 0873US6636063B2Probe card with contact apparatus and method of manufactureTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 21, 2003·18 cites·22 claims
- 0969US5649981ATool and fixture for the removal of tab leads bonded to semiconductor die padsTEXAS INSTRUMENTS INC·Filed 1996·Granted Jul 22, 1997·36 cites·4 claims
- 1066US6988165B2System and method for intelligent write management of disk pages in cache checkpoint operationsPERVASIVE SOFTWARE INC·Filed 2003·Granted Jan 17, 2006·25 cites·24 claims
- 1164US6553661B2Semiconductor test structure having a laser defined current carrying structureTEXAS INSTRUMENTS INC·Filed 2001·Granted Apr 29, 2003·10 cites·20 claims
- 1261US6209532B1Soft handling process tooling for low and medium volume known good die productTEXAS INSTRUMENTS INC·Filed 2000·Granted Apr 3, 2001·8 cites·18 claims
- 1354US6376352B1Stud-cone bump for probe tips used in known good die carriersTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 23, 2002·15 cites·16 claims
- 1452US10445310B2Utilization of a concept to obtain data of specific interest to a user from one or more data storage locationsIBM·Filed 2014·Granted Oct 15, 2019·0 cites·9 claims
- 1551US6489673B2Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriersTEXAS INSTRUMENTS INC·Filed 2001·Granted Dec 3, 2002·5 cites·20 claims
- 1650US6276563B1Verification and lockout apparatus for bulk feederMOTOROLA INC·Filed 1999·Granted Aug 21, 2001·20 cites·23 claims
- 1749US10515069B2Utilization of a concept to obtain data of specific interest to a user from one or more data storage locationsIBM·Filed 2015·Granted Dec 24, 2019·0 cites·10 claims
- 1843US2005140382A1High density, area array probe card apparatusFiled 2005·Application pending·0 cites
- 1943US2009039524A1Methods and apparatus to support an overhanging region of a stacked dieTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 2041US7122895B2Stud-cone bump for probe tips used in known good die carriersTEXAS INSTRUMENTS INC·Filed 2001·Granted Oct 17, 2006·1 cites·8 claims
- 2140US2009166810A1Semiconductor Device Crack-Deflecting Structure and MethodSTILLMAN DANIEL JOSEPH·Filed 2007·Application pending·0 cites
- 2239US6335226B1Digital signal processor/known good die packaging using rerouted existing package for test and burn-in carriersTEXAS INSTRUMENTS INC·Filed 2000·Granted Jan 1, 2002·1 cites·12 claims
- 2336US2003088975A1Semiconductor test structure having a laser defined current carrying structureFiled 2002·Application pending·0 cites
- 2436US2005151273A1Semiconductor chip packageFiled 2003·Application pending·0 cites
- 2535US6720780B2High density probe card apparatus and method of manufactureTEXAS INSTRUMENTS INC·Filed 2001·Granted Apr 13, 2004·0 cites·25 claims
- 2635US2004169521A1High density probe card apparatus and method of manufactureFiled 2004·Application pending·0 cites
- 2734US2003094962A1Dual plane probe card assembly and method of manufactureFiled 2001·Application pending·0 cites
- 2831US7898275B1Known good die using existing process infrastructureTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 1, 2011·3 cites·17 claims
- 2927US5591649AProcess of removing a tape automated bonded semiconductor from bonded leadsTEXAS INSTRUMENTS INC·Filed 1995·Granted Jan 7, 1997·1 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →