Inventor · disambiguated record
Richard Allan Deckert
Also filed as: DECKERT RICHARD ALLAN
3 granted patents·329 citations·filing 1998–1999
76Inventor score
Files withSONY CORP3
Top patents by PatentIndex Score
3 records- 0194US6137303AIntegrated testing method and apparatus for semiconductor test operations processingSONY CORP·Filed 1998·Granted Oct 24, 2000·255 cites·24 claims
- 0285US6259261B1Method and apparatus for electrically testing semiconductor devices fabricated on a waferSONY CORP·Filed 1999·Granted Jul 10, 2001·72 cites·11 claims
- 0328US6203411B1Method and apparatus for polishing electrical probesSONY CORP·Filed 1998·Granted Mar 20, 2001·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →