Inventor · disambiguated record
Richard A. Mauritzson
Also filed as: MAURITZSON RICHARD · MAURITZSON RICHARD A
50 granted patents·13 pending applications·505 citations·filing 2003–2024
98Inventor score
Files withMICRON TECHNOLOGY INC21SEMICONDUCTOR COMPONENTS IND LLC17APTINA IMAGING CORP14ALTICE JR PETER P2MAURITZSON RICHARD A2
Top patents by PatentIndex Score
63 records- 0195US9888198B2Imaging systems having image sensor pixel arrays with sub-pixel resolution capabilitiesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2014·Granted Feb 6, 2018·41 cites·16 claims
- 0294US9350914B1Methods of enforcing privacy requests in imaging systemsSEMICONDUCTOR COMPONENTS IND·Filed 2015·Granted May 24, 2016·32 cites·21 claims
- 0394US7985658B2Method of forming substrate for use in imager devicesAPTINA IMAGING CORP·Filed 2009·Granted Jul 26, 2011·33 cites·18 claims
- 0494US7432148B2Shallow trench isolation by atomic-level silicon reconstructionMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 7, 2008·31 cites·30 claims
- 0594US7002231B2Barrier regions for image sensorsMICRON TECHNOLOGY INC·Filed 2004·Granted Feb 21, 2006·71 cites·53 claims
- 0694US6897082B2Method of forming well for CMOS imagerMICRON TECHNOLOGY INC·Filed 2003·Granted May 24, 2005·54 cites·27 claims
- 0793US7485836B2Row driver for selectively supplying operating power to imager pixelMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 3, 2009·12 cites·11 claims
- 0893US7459668B2Method, apparatus, and system to reduce ground resistance in a pixel arrayMICRON TECHNOLOGY INC·Filed 2007·Granted Dec 2, 2008·17 cites·34 claims
- 0992US9686486B2Multi-resolution pixel architecture with shared floating diffusion nodesSEMICONDUCTOR COMPONENTS IND LLC·Filed 2015·Granted Jun 20, 2017·10 cites·21 claims
- 1092US7768047B2Imager element, device and system with recessed transfer gateMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 3, 2010·17 cites·28 claims
- 1192US7728279B2Methods, devices, and systems related to pixel arraysAPTINA IMAGING CORP·Filed 2008·Granted Jun 1, 2010·14 cites·20 claims
- 1291US12034025B2Semiconductor devices with single-photon avalanche diodes and isolation structuresSEMICONDUCTOR COMPONENTS IND LLC·Filed 2021·Granted Jul 9, 2024·2 cites·20 claims
- 1390US7800146B2Implanted isolation region for imager pixelsAPTINA IMAGING CORP·Filed 2005·Granted Sep 21, 2010·13 cites·34 claims
- 1489US7847366B2Well for CMOS imagerMICRON TECHNOLOGY INC·Filed 2009·Granted Dec 7, 2010·7 cites·9 claims
- 1589US7829832B2Method for operating a pixel cell using multiple pulses to a transistor transfer gateAPTINA IMAGING CORP·Filed 2005·Granted Nov 9, 2010·19 cites·7 claims
- 1689US7226803B2Photodiode with ultra-shallow junction for high quantum efficiency CMOS image sensor and method of formationMICRON TECHNOLOGY INC·Filed 2005·Granted Jun 5, 2007·9 cites·27 claims
- 1787US12407954B2Image sensors having high dynamic range pixelsSEMICONDUCTOR COMPONENTS IND LLC·Filed 2022·Granted Sep 2, 2025·1 cites·22 claims
- 1886US7176434B2Row driven imager pixelMICRON TECHNOLOGY INC·Filed 2005·Granted Feb 13, 2007·6 cites·27 claims
- 1985US9871068B1Methods and apparatus for an image sensor with a multi-branch transistorSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Jan 16, 2018·4 cites·14 claims
- 2085US9848148B1Methods and apparatus for a multiple storage pixel imaging systemSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Dec 19, 2017·4 cites·20 claims
- 2184US8138462B2Resetting a row driven imager pixelALTICE JR PETER P·Filed 2010·Granted Mar 20, 2012·4 cites·21 claims
- 2283US7902624B2Barrier regions for image sensorsAPTINA IMAGING CORP·Filed 2005·Granted Mar 8, 2011·6 cites·23 claims
- 2383US7749798B2Optimized photodiode process for improved transfer gate leakageAPTINA IMAGING CORP·Filed 2005·Granted Jul 6, 2010·6 cites·55 claims
- 2483US7511354B2Well for CMOS imager and method of formationMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 31, 2009·4 cites·8 claims
- 2582US7498188B2Contacts for CMOS imagers and method of formationAPTINA IMAGING CORP·Filed 2005·Granted Mar 3, 2009·9 cites·10 claims
- 2681US7772027B2Barrier regions for image sensorsAPTINA IMAGING CORP·Filed 2005·Granted Aug 10, 2010·5 cites·20 claims
- 2781US7642608B2Dual isolation for image sensorsAPTINA IMAGING CORP·Filed 2007·Granted Jan 5, 2010·5 cites·20 claims
- 2881US7122408B2Photodiode with ultra-shallow junction for high quantum efficiency CMOS image sensor and method of formationMICRON TECHNOLOGY INC·Filed 2003·Granted Oct 17, 2006·19 cites·30 claims
- 2980US12310139B2Semiconductor devices with single-photon avalanche diodes and isolation structuresSEMICONDUCTOR COMPONENTS IND LLC·Filed 2024·Granted May 20, 2025·0 cites·20 claims
- 3079US7662658B2Photodiode with ultra-shallow junction for high quantum efficiency CMOS image sensor and method of formationMICRON TECHNOLOGY INC·Filed 2007·Granted Feb 16, 2010·3 cites·30 claims
- 3178US7737388B2Row driven imager pixelROUND ROCK RES LLC·Filed 2007·Granted Jun 15, 2010·3 cites·47 claims
- 3276US7858914B2Method and apparatus for reducing dark current and hot pixels in CMOS image sensorsAPTINA IMAGING CORP·Filed 2007·Granted Dec 28, 2010·4 cites·14 claims
- 3376US7724293B2Multi-purpose image sensor circuits, imager, system and method of operationAPTINA IMAGING CORP·Filed 2007·Granted May 25, 2010·4 cites·34 claims
- 3475US9930281B2Image sensors having photodiode regions implanted from multiple sides of a substrateSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Mar 27, 2018·1 cites·18 claims
- 3575US8314498B2Isolated bond pad with conductive via interconnectHUTTO KEVIN·Filed 2010·Granted Nov 20, 2012·6 cites·15 claims
- 3675US7573113B2Photodiode with ultra-shallow junction for high quantum efficiency CMOS image sensor and method of formationMICRON TECHNOLOGY INC·Filed 2005·Granted Aug 11, 2009·2 cites·20 claims
- 3774US7196304B2Row driver for selectively supplying operating power to imager pixelMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 27, 2007·7 cites·9 claims
- 3872US7190041B2Well for CMOS imagerMICRON TECHNOLOGY INC·Filed 2005·Granted Mar 13, 2007·1 cites·21 claims
- 3971US10475832B2High dynamic range pixel using light separationSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Nov 12, 2019·1 cites·10 claims
- 4069US7652704B2Pixel for boosting pixel reset voltageAPTINA IMAGING CORP·Filed 2004·Granted Jan 26, 2010·7 cites·20 claims
- 4168US10566375B2Stacked-die image sensors with shieldingSEMICONDUCTOR COMPONENTS IND LLC·Filed 2016·Granted Feb 18, 2020·1 cites·20 claims
- 4265US8026969B2Pixel for boosting pixel reset voltageAPTINA IMAGING CORP·Filed 2009·Granted Sep 27, 2011·1 cites·12 claims
- 4363US7420233B2Photodiode for improved transfer gate leakageMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 2, 2008·8 cites·62 claims
- 4460US11133346B2Stacked-die image sensors with shieldingSEMICONDUCTOR COMPONENTS IND LLC·Filed 2019·Granted Sep 28, 2021·0 cites·8 claims
- 4559US8129761B2Contacts for CMOS imagers and method of formationFAN XIAOFENG·Filed 2009·Granted Mar 6, 2012·1 cites·14 claims
- 4659US2025125284A1Arc prevention for bonded wafers of a chip stackSEMICONDUCTOR COMPONENTS IND LLC·Filed 2023·Application pending·0 cites
- 4759US2020020730A1High dynamic range pixel using light separationSEMICONDUCTOR COMPONENTS IND LLC·Filed 2019·Application pending·0 cites
- 4857US2024371905A1Chip stacking with bond pad above a bondlineSEMICONDUCTOR COMPONENTS IND LLC·Filed 2023·Application pending·0 cites
- 4955US8105864B2Method of forming barrier regions for image sensorsRHODES HOWARD E·Filed 2006·Granted Jan 31, 2012·0 cites·21 claims
- 5054US7755121B2Imagers, apparatuses and systems utilizing pixels with improved optical resolution and methods of operating the sameAPTINA IMAGING CORP·Filed 2007·Granted Jul 13, 2010·0 cites·21 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Richard A. Mauritzson files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →