Inventor · disambiguated record
Richard V. Orlando
Also filed as: ORLANDO RICHARD V · ORLANDO RICHARD VINCENT
11 granted patents·235 citations·filing 1998–2007
91Inventor score
Top patents by PatentIndex Score
11 records- 0193US8188952B1System and method for reducing LCD flickerORLANDO RICHARD V·Filed 2007·Granted May 29, 2012·23 cites·13 claims
- 0290US6185127B1Selectable analog functions on a configurable device and method employing nonvolatile memorySUMMIT MICROELECTRONICS INC·Filed 2000·Granted Feb 6, 2001·76 cites·20 claims
- 0387US7061380B1Monitoring and recording tag with RF interface and indicator for fault eventALTA ANALOG INC·Filed 2003·Granted Jun 13, 2006·64 cites·17 claims
- 0485US7557788B1Gamma reference voltage generatorALTA ANALOG INC·Filed 2007·Granted Jul 7, 2009·6 cites·6 claims
- 0579US8194015B1Reduction of the effect of AVDD power supply variation on gamma reference voltages and the ability to compensate for manufacturing variationsORLANDO RICHARD V·Filed 2007·Granted Jun 5, 2012·5 cites·1 claims
- 0676US7233305B1Gamma reference voltage generatorALTA ANALOG INC·Filed 2003·Granted Jun 19, 2007·14 cites·14 claims
- 0769US7554843B1Serial bus incorporating high voltage programming signalsALTA ANALOG INC·Filed 2005·Granted Jun 30, 2009·7 cites·26 claims
- 0864US6985372B1Analog content addressable memory (CAM) employing analog nonvolatile storageALTA ANALOG INC·Filed 2003·Granted Jan 10, 2006·13 cites·47 claims
- 0954US6020082AIntegrated battery identification system and method for determination of battery type and voltage level operabilitySUMMIT MICROELECTRONICS INC·Filed 1998·Granted Feb 1, 2000·23 cites·11 claims
- 1042US6693828B1Method for compensating field-induced retention loss in non-volatile storage with reference cellsALTA ANALOG INC·Filed 2003·Granted Feb 17, 2004·3 cites·33 claims
- 1134US6388928B1Method and system for reduction of test time for analog chip manufacturingSUMMIT MICROELECTRONICS INC·Filed 2001·Granted May 14, 2002·1 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →