Inventor · disambiguated record
Richard Slobodnik
Also filed as: SLOBODNIK RICHARD
10 granted patents·94 citations·filing 2001–2020
87Inventor score
Top patents by PatentIndex Score
10 records- 0186US7062689B2Method and apparatus for memory self testingADVANCED RISC MACH LTD·Filed 2001·Granted Jun 13, 2006·49 cites·8 claims
- 0279US11568926B2Latch circuitry for memory applicationsADVANCED RISC MACH LTD·Filed 2020·Granted Jan 31, 2023·1 cites·20 claims
- 0373US7308623B2Integrated circuit and method for testing memory on the integrated circuitADVANCED RISC MACH LTD·Filed 2005·Granted Dec 11, 2007·11 cites·11 claims
- 0473US7269766B2Method and apparatus for memory self testingADVANCED RISC MACH LTD·Filed 2001·Granted Sep 11, 2007·20 cites·34 claims
- 0566US10222418B2Scan cell for dual port memory applicationsADVANCED RISC MACH LTD·Filed 2016·Granted Mar 5, 2019·1 cites·18 claims
- 0662US7293212B2Memory self-test via a ring bus in a data processing apparatusARM LIMTED·Filed 2005·Granted Nov 6, 2007·5 cites·22 claims
- 0761US10847211B2Latch circuitry for memory applicationsADVANCED RISC MACH LTD·Filed 2018·Granted Nov 24, 2020·1 cites·18 claims
- 0857US7053675B2Switching between clocks in data processingADVANCED RISC MACH LTD·Filed 2003·Granted May 30, 2006·6 cites·19 claims
- 0939US11280832B1Memory embedded full scan for latent defectsADVANCED RISC MACH LTD·Filed 2020·Granted Mar 22, 2022·0 cites·18 claims
- 1032US7434119B2Method and apparatus for memory self testingADVANCED RISC MACH LTD·Filed 2005·Granted Oct 7, 2008·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →