Inventor · disambiguated record
Richard Stallcup
Also filed as: STALLCUP II RICHARD E · STALLCUP RICHARD · STALLCUP RICHARD E
13 granted patents·3 pending applications·196 citations·filing 2003–2024
92Inventor score
Top patents by PatentIndex Score
16 records- 0195US7319336B2Charged particle beam device probe operationZYVEX INSTR LLC·Filed 2005·Granted Jan 15, 2008·63 cites·19 claims
- 0293US7326293B2Patterned atomic layer epitaxyZYVEX LABS LLC·Filed 2005·Granted Feb 5, 2008·27 cites·26 claims
- 0392US9891280B2Probe-based data collection system with adaptive mode of probing controlled by local sample propertiesFEI EFA INC·Filed 2016·Granted Feb 13, 2018·7 cites·13 claims
- 0487US7675300B2Charged particle beam device probe operationZYVEX INSTR LLC·Filed 2007·Granted Mar 9, 2010·12 cites·27 claims
- 0587US7285778B2Probe current imagingZYVEX CORP·Filed 2005·Granted Oct 23, 2007·8 cites·20 claims
- 0686US8895923B2System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingDCG SYSTEMS INC·Filed 2013·Granted Nov 25, 2014·7 cites·20 claims
- 0785US9057740B1Probe-based data collection system with adaptive mode of probingDCG SYSTEMS INC·Filed 2013·Granted Jun 16, 2015·7 cites·20 claims
- 0885US6812460B1Nano-manipulation by gyrationZYVEX CORP·Filed 2003·Granted Nov 2, 2004·36 cites·20 claims
- 0972US9506947B2System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingDCG SYSTEMS INC·Filed 2014·Granted Nov 29, 2016·2 cites·18 claims
- 1070US6987277B2Systems and method for picking and placing of nanoscale objects utilizing differences in chemical and physical binding forcesZYVEX CORP·Filed 2003·Granted Jan 17, 2006·26 cites·23 claims
- 1169US7799132B2Patterned atomic layer epitaxyZYVEX LABS LLC·Filed 2007·Granted Sep 21, 2010·1 cites·31 claims
- 1266US2025180600A1Probe tip x-y location identification using a charged particle beamINNOVATUM INSTR INC·Filed 2024·Application pending·0 cites
- 1362US12169208B2Probe tip X-Y location identification using a charged particle beamINNOVATUM INSTR INC·Filed 2022·Granted Dec 17, 2024·0 cites·28 claims
- 1449US2014380531A1Probe-based data collection system with adaptive mode of probing controlled by local sample propertiesDCG SYSTEMS INC·Filed 2014·Application pending·0 cites
- 1543US12306241B2Automated probe landingINNOVATUM INSTR INC·Filed 2022·Granted May 20, 2025·0 cites·25 claims
- 1635US2016370425A1Particle Beam Heating to Identify DefectsDCG SYSTEMS INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →