Inventor · disambiguated record
Richard L. Woodruff
Also filed as: WOODRUFF RICHARD L
12 granted patents·262 citations·filing 1988–2016
92Inventor score
Files withUNITED TECHNOLOGIES CORP5WOODRUFF RICHARD L2AEROFLEX COLORADO SPRINGS INC1AEROFLEX UTMC MICROELECTRONICS1HEWLETT PACKARD DEVELOPMENT CO1
Top patents by PatentIndex Score
12 records- 0182US5811855ASOI combination body tieUNITED TECHNOLOGIES CORP·Filed 1997·Granted Sep 22, 1998·53 cites·20 claims
- 0281US5145802AMethod of making SOI circuit with buried connectorsUNITED TECHNOLOGIES CORP·Filed 1991·Granted Sep 8, 1992·74 cites·18 claims
- 0380US6271568B1Voltage controlled resistance modulation for single event upset immunityUTMC MICROELECTRONIC SYSTEMS I·Filed 1997·Granted Aug 7, 2001·52 cites·38 claims
- 0475US10132093B2Framing template tool and method of using sameWOODRUFF RICHARD L·Filed 2016·Granted Nov 20, 2018·5 cites·20 claims
- 0563US5298773ASilicon-on-insulator H-transistor layout for gate arraysUNITED TECHNOLOGIES CORP·Filed 1992·Granted Mar 29, 1994·24 cites·41 claims
- 0651US5525533AMethod of making a low voltage coefficient capacitorUNITED TECHNOLOGIES CORP·Filed 1995·Granted Jun 11, 1996·18 cites·10 claims
- 0748US6855618B2Radiation hardened semiconductor deviceAEROFLEX COLORADO SPRINGS INC·Filed 2002·Granted Feb 15, 2005·2 cites·19 claims
- 0846US6511893B1Radiation hardened semiconductor deviceAEROFLEX UTMC MICROELECTRONICS·Filed 1998·Granted Jan 28, 2003·13 cites·39 claims
- 0942US7076376B1System and method for calibrating weak write test mode (WWTM)HEWLETT PACKARD DEVELOPMENT CO·Filed 2004·Granted Jul 11, 2006·3 cites·26 claims
- 1041US6063690AMethod for making recessed field oxide for radiation hardened microelectronicsUTMC MICROELECTRONICS SYSTEMS·Filed 1997·Granted May 16, 2000·14 cites·20 claims
- 1132USD858230SFraming toolWOODRUFF RICHARD L·Filed 2015·Granted Sep 3, 2019·1 cites·1 claims
- 1228US5037781AMulti-layered field oxide structureUNITED TECHNOLOGIES CORP·Filed 1988·Granted Aug 6, 1991·3 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →