Inventor · disambiguated record
Richard K. Workman
Also filed as: WORKMAN RICHARD · WORKMAN RICHARD K · WORKMAN RICHARD KENTON
8 granted patents·6 pending applications·18 citations·filing 2006–2022
80Inventor score
Files withAGILENT TECHNOLOGIES INC10ABRAMOVITCH DANIEL YVES1FROMM DAVID PATRICK1WORKMAN RICHARD K1WORKMAN RICHARD KENTON1
Top patents by PatentIndex Score
14 records- 0184US11494988B2Method and system for implementing augmented reality (AR)-based assistance within work environmentAGILENT TECHNOLOGIES INC·Filed 2019·Granted Nov 8, 2022·4 cites·23 claims
- 0274US8769710B2Atomic force microscope system using selective active dampingAGILENT TECHNOLOGIES INC·Filed 2012·Granted Jul 1, 2014·3 cites·15 claims
- 0373US7659509B2System for scanning probe microscope input deviceAGILENT TECHNOLOGIES INC·Filed 2006·Granted Feb 9, 2010·5 cites·19 claims
- 0469US11847751B2Method and system for implementing augmented reality (AR)-based assistance within work environmentAGILENT TECHNOLOGIES INC·Filed 2022·Granted Dec 19, 2023·0 cites·20 claims
- 0566US7421899B2Resonance method for determining the spring constant of scanning probe microscope cantilevers using MEMS actuatorsAGILENT TECHNOLOGIES INC·Filed 2006·Granted Sep 9, 2008·4 cites·19 claims
- 0659US7987006B2Automatic generation of PID parameters for a scanning probe microscopeAGILENT TECHNOLOGIES INC·Filed 2007·Granted Jul 26, 2011·2 cites·18 claims
- 0757US2024118295A1Apparatus and methods for transferring a tissue sectionAGILENT TECHNOLOGIES INC·Filed 2022·Application pending·0 cites
- 0847US2019195748A1Apparatus and methods for transferring a tissue sectionAGILENT TECHNOLOGIES INC·Filed 2018·Application pending·0 cites
- 0943US10217011B2Apparatus and method for facilitating manual sorting of slidesAGILENT TECHNOLOGIES INC·Filed 2017·Granted Feb 26, 2019·0 cites·20 claims
- 1043US7395697B2Force method for determining the spring constant of scanning probe microscope cantilevers using MEMS actuatorsAGILENT TECHNOLOGIES INC·Filed 2006·Granted Jul 8, 2008·0 cites·20 claims
- 1137US2008011046A1Displacement Method for Determining the Spring Constant of Scanning Probe Microscope Cantileers using MEMS ActuatorsWORKMAN RICHARD K·Filed 2006·Application pending·0 cites
- 1237US2010269232A1Scanning Probe Microscope that Outputs Metadata with ImageWORKMAN RICHARD KENTON·Filed 2009·Application pending·0 cites
- 1335US2009139313A1Time-Tagged Data for Atomic Force MicroscopyFROMM DAVID PATRICK·Filed 2007·Application pending·0 cites
- 1431US2009112957A1System and methods for data sample decimation and display of scanning probe microscope imagesABRAMOVITCH DANIEL YVES·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →