Inventor · disambiguated record
Robert Dean Adams
Also filed as: ADAMS ROBERT D · ADAMS ROBERT DEAN · COVINO JAMES J
16 granted patents·701 citations·filing 1987–1999
95Inventor score
Files withIBM16
Top patents by PatentIndex Score
16 records- 0195US5535164ABIST tester for multiple memoriesIBM·Filed 1995·Granted Jul 9, 1996·149 cites·18 claims
- 0295US5313424AModule level electronic redundancyIBM·Filed 1992·Granted May 17, 1994·157 cites·10 claims
- 0393US4782250ACMOS off-chip driver circuitsIBM·Filed 1987·Granted Nov 1, 1988·67 cites·18 claims
- 0492US5796745AMemory array built-in self test circuit for testing multi-port memory arraysIBM·Filed 1996·Granted Aug 18, 1998·105 cites·20 claims
- 0584US5740098AUsing one memory to supply addresses to an associated memory during testingIBM·Filed 1996·Granted Apr 14, 1998·47 cites·5 claims
- 0682US5784323ATest converage of embedded memories on semiconductor substratesIBM·Filed 1997·Granted Jul 21, 1998·50 cites·17 claims
- 0771US5793592ADynamic dielectric protection circuit for a receiverIBM·Filed 1997·Granted Aug 11, 1998·25 cites·15 claims
- 0869US5790564AMemory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method thereforIBM·Filed 1995·Granted Aug 4, 1998·25 cites·3 claims
- 0969US5563833AUsing one memory to supply addresses to an associated memory during testingIBM·Filed 1995·Granted Oct 8, 1996·23 cites·17 claims
- 1052US5771242AMemory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method thereforIBM·Filed 1996·Granted Jun 23, 1998·12 cites·12 claims
- 1149US5761213AMethod and apparatus to determine erroneous value in memory cells using data compressionIBM·Filed 1996·Granted Jun 2, 1998·11 cites·17 claims
- 1248US5802070ATesting associative memoryIBM·Filed 1996·Granted Sep 1, 1998·11 cites·7 claims
- 1346US5745498ARapid compare of two binary numbersIBM·Filed 1996·Granted Apr 28, 1998·8 cites·25 claims
- 1437US6353903B1Method and apparatus for testing differential signalsIBM·Filed 1994·Granted Mar 5, 2002·6 cites·11 claims
- 1530US6269461B1Testing method for dynamic logic keeper deviceIBM·Filed 1998·Granted Jul 31, 2001·0 cites·6 claims
- 1628US6252417B1Fault identification by voltage potential signatureIBM·Filed 1999·Granted Jun 26, 2001·5 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →