Inventor · disambiguated record
Ronald Baker
Also filed as: BAKER RONALD · BAKER RONALD K · BAKER RONALD N
8 granted patents·7 pending applications·25 citations·filing 2001–2015
80Inventor score
Top patents by PatentIndex Score
15 records- 0181US8931561B2Soft landing system and method of achieving sameBAKER RONALD·Filed 2011·Granted Jan 13, 2015·11 cites·20 claims
- 0259US6744271B2Internal generation of reference voltageINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 1, 2004·10 cites·25 claims
- 0352US8429384B2Interleaved hardware multithreading processor architecturePENNOCK JAMES D·Filed 2006·Granted Apr 23, 2013·1 cites·31 claims
- 0447US7457170B2Memory device that provides test results to multiple output padsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Nov 25, 2008·2 cites·25 claims
- 0544US7873857B2Multi-component module fly-by output alignment arrangement and methodQIMONDA AG·Filed 2007·Granted Jan 18, 2011·1 cites·12 claims
- 0643US8074053B2Dynamic instruction and data updating architecturePENNOCK JAMES D·Filed 2006·Granted Dec 6, 2011·0 cites·25 claims
- 0741US9141567B2Serial communication input output interface enginePENNOCK JAMES D·Filed 2007·Granted Sep 22, 2015·0 cites·20 claims
- 0841US2008016289A1External memory interface enginePENNOCK JAMES D·Filed 2007·Application pending·0 cites
- 0936US9347292B2Soft landing system and method of achieving sameVELCO GRAY INC·Filed 2015·Granted May 24, 2016·0 cites·20 claims
- 1036US2002047856A1Web based stacked imagesFiled 2001·Application pending·0 cites
- 1132US2006236185A1Multiple function results using single pattern and methodBAKER RONALD·Filed 2005·Application pending·0 cites
- 1231US2007046308A1Test modes for a semiconductor integrated circuit deviceBAKER RONALD·Filed 2005·Application pending·0 cites
- 1329US2007109888A1Integrated circuit with test circuitBAKER RONALD·Filed 2005·Application pending·0 cites
- 1429US2007088993A1Memory tester having master/slave configurationBAKER RONALD·Filed 2005·Application pending·0 cites
- 1527US2003212939A1Method and apparatus for selecting the operational mode of an integrated circuitFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →