Inventor · disambiguated record
Robert Blunn
Also filed as: BLUNN ROBERT G
5 granted patents·3 pending applications·58 citations·filing 2001–2007
82Inventor score
Files withMICRON TECHNOLOGY INC7
Top patents by PatentIndex Score
8 records- 0189US7383147B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2006·Granted Jun 3, 2008·15 cites·20 claims
- 0288US7165004B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 16, 2007·14 cites·19 claims
- 0370US7139672B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 21, 2006·10 cites·23 claims
- 0469US7162386B2Dynamically adaptable semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 9, 2007·10 cites·71 claims
- 0566US7337088B2Intelligent measurement modular semiconductor parametric test systemMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 26, 2008·9 cites·15 claims
- 0648US2006212253A1Intelligent measurement modular semiconductor parametric test systemMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 0742US2007112538A1Concurrent control of semiconductor parametric testingMICRON TECHNOLOGY INC·Filed 2007·Application pending·0 cites
- 0835US2002152046A1Concurrent control of semiconductor parametric testingFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →