Inventor · disambiguated record
Rodney A. Browen
Also filed as: BROWEN RODNEY · BROWEN RODNEY A
10 granted patents·177 citations·filing 1983–1998
90Inventor score
Technology areasG01R
Top patents by PatentIndex Score
10 records- 0180US6263476B1Method and apparatus for selecting targeted components in limited access testAGILENT TECHNOLOGIES INC·Filed 1998·Granted Jul 17, 2001·48 cites·34 claims
- 0273US4642561ACircuit tester having on-the-fly comparison of actual and expected signals on test pins and improved homing capabilityHEWLETT PACKARD CO·Filed 1984·Granted Feb 10, 1987·27 cites·1 claims
- 0369US4652814ACircuit testing utilizing data compression and derivative mode vectorsHEWLETT PACKARD CO·Filed 1983·Granted Mar 24, 1987·21 cites·13 claims
- 0465US6327545B1Method and apparatus for board model correctionAGILENT TECHNOLOGIES INC·Filed 1998·Granted Dec 4, 2001·26 cites·42 claims
- 0558US4598245ACircuit tester having indirect countersHEWLETT PACKARD CO·Filed 1984·Granted Jul 1, 1986·15 cites·12 claims
- 0657US6334100B1Method and apparatus for electronic circuit model correctionAGILENT TECHNOLOGIES INC·Filed 1998·Granted Dec 25, 2001·23 cites·28 claims
- 0738US6266787B1Method and apparatus for selecting stimulus locations during limited access circuit testAGILENT TECHNOLOGIES INC·Filed 1998·Granted Jul 24, 2001·8 cites·31 claims
- 0837US6467051B1Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit testAGILENT TECHNOLOGIES INC·Filed 1998·Granted Oct 15, 2002·7 cites·12 claims
- 0930US6233706B1Method and apparatus for limited access circuit testAGILENT TECHNOLOGIES INC·Filed 1998·Granted May 15, 2001·2 cites·21 claims
- 1029US6237118B1Method and apparatus for correcting for detector inaccuracies in limited access testingAGILENT TECHNOLOGIES INC·Filed 1998·Granted May 22, 2001·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →