Inventor · disambiguated record
Roberto Crippa
Also filed as: CRIPPA ROBERTO
20 granted patents·6 pending applications·20 citations·filing 2003–2023
90Inventor score
Top patents by PatentIndex Score
26 records- 0185US12032003B2Probe head for electronic devices and corresponding probe cardTECHNOPROBE SPA·Filed 2022·Granted Jul 9, 2024·1 cites·9 claims
- 0284US11828774B2Testing head with improved frequency propertyTECHNOPROBE SPA·Filed 2019·Granted Nov 28, 2023·2 cites·25 claims
- 0384US11293941B2Interface element for a testing apparatus of electronic devices and corresponding manufacturing methodTECHNOPROBE SPA·Filed 2020·Granted Apr 5, 2022·2 cites·16 claims
- 0482US10551433B2Testing head comprising vertical probesTECHNOPROBE SPA·Filed 2017·Granted Feb 4, 2020·4 cites·41 claims
- 0580US10782319B2Probe card for electronics devicesTECHNOPROBE SPA·Filed 2018·Granted Sep 22, 2020·2 cites·6 claims
- 0675US2023324438A1Testing head with improved frequency propertyTECHNOPROBE SPA·Filed 2023·Application pending·0 cites
- 0770US11442080B2Contact probe and relative probe head of an apparatus for testing electronic devicesTECHNOPROBE SPA·Filed 2021·Granted Sep 13, 2022·0 cites·20 claims
- 0864US11016122B2Contact probe and relative probe head of an apparatus for testing electronic devicesTECHNOPROBE SPA·Filed 2019·Granted May 25, 2021·0 cites·23 claims
- 0960US2022155344A1Manufacturing method for manufacturing contact probes for probe heads of electronic devices and corresponding contact probeTECHNOPROBE SPA·Filed 2022·Application pending·0 cites
- 1058US10228392B2Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Granted Mar 12, 2019·1 cites·36 claims
- 1154US12455299B2Contact element for a probe head for testing high-frequency electronic devices and relating probe headTECHNOPROBE SPA·Filed 2021·Granted Oct 28, 2025·0 cites·20 claims
- 1254US9429593B2Testing head for a test equipment of electronic devicesCRIPPA ROBERTO·Filed 2012·Granted Aug 30, 2016·1 cites·18 claims
- 1353US10365299B2Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished productTECHNOPROBE SPA·Filed 2017·Granted Jul 30, 2019·0 cites·35 claims
- 1453US2017269125A1Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Application pending·0 cites
- 1552US7465175B2System for unmating a connector pairCIT ALCATEL·Filed 2006·Granted Dec 16, 2008·7 cites·21 claims
- 1650US11953522B2Probe head for reduced-pitch applicationsTECHNOPROBE SPA·Filed 2020·Granted Apr 9, 2024·0 cites·20 claims
- 1749US11029337B2Vertical probe testing head with improved frequency propertiesTECHNOPROBE SPA·Filed 2019·Granted Jun 8, 2021·0 cites·28 claims
- 1848US12105118B2Testing head with an improved contact between contact probes and guide holesTECHNOPROBE SPA·Filed 2020·Granted Oct 1, 2024·0 cites·15 claims
- 1948US2024044940A1Contact probe for probe heads of electronic devicesTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 2045US11340262B2Contact probe for a testing head for testing high-frequency devicesTECHNOPROBE SPA·Filed 2020·Granted May 24, 2022·0 cites·15 claims
- 2144US12019111B2Manufacturing method of a multi-layer for a probe cardTECHNOPROBE SPA·Filed 2019·Granted Jun 25, 2024·0 cites·20 claims
- 2243US2023288447A1Contact probe for a probe headTECHNOPROBE SPA·Filed 2021·Application pending·0 cites
- 2340US9829508B2Testing head of electronic devicesTECHNOPROBE SPA·Filed 2015·Granted Nov 28, 2017·0 cites·24 claims
- 2439US2017122980A1Contact probe for a testing head and corresponding manufacturing methodTECHNOPROBE SPA·Filed 2017·Application pending·0 cites
- 2538US7004779B2Device for hooking/unhooking LC connectorsCIT ALCATEL·Filed 2003·Granted Feb 28, 2006·0 cites·11 claims
- 2631US10151775B2High-planarity probe card for a testing apparatus for electronic devicesTECHNOPROBE SPA·Filed 2016·Granted Dec 11, 2018·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →