Inventor · disambiguated record
Robert V. Falsetti
Also filed as: FALSETTI ROBERT · FALSETTI ROBERT V · FALSETTI ROBERT VINCENT
10 granted patents·2 pending applications·188 citations·filing 1993–2016
89Inventor score
Top patents by PatentIndex Score
12 records- 0187US7017414B2Ultrasonic inspection method and system thereforGEN ELECTRIC·Filed 2003·Granted Mar 28, 2006·36 cites·19 claims
- 0283US7546685B2Process for producing a rotorGEN ELECTRIC·Filed 2005·Granted Jun 16, 2009·13 cites·20 claims
- 0383US7065872B2Method of processing a multiple alloy rotorGEN ELECTRIC·Filed 2003·Granted Jun 27, 2006·29 cites·20 claims
- 0474US6512982B2Methods and systems for evaluating defects in metalsGEN ELECTRIC·Filed 2000·Granted Jan 28, 2003·34 cites·44 claims
- 0573US5445029ACalibration and flaw detection method for ultrasonic inspection of acoustically noisy materialsGEN ELECTRIC·Filed 1993·Granted Aug 29, 1995·35 cites·20 claims
- 0669US5618994ACalibration method using a Pitch-Catch arrangement for ultrasonic inspection of acoustically noisy materialsGEN ELECTRIC·Filed 1995·Granted Apr 8, 1997·33 cites·8 claims
- 0768US6807860B1Multiple alloy rotor transition zone measurement system and methodGEN ELECTRIC·Filed 2003·Granted Oct 26, 2004·8 cites·11 claims
- 0849US2002116084A1Method and system for qualifying and controlling supplier test processesFiled 2000·Application pending·0 cites
- 0947US7757364B2Methods for modifying finished machine component forgings for ultrasonic inspection coverageGEN ELECTRIC·Filed 2006·Granted Jul 20, 2010·0 cites·5 claims
- 1046US8235663B2Article and ultrasonic inspection method and system thereforROSE CURTIS WAYNE·Filed 2008·Granted Aug 7, 2012·0 cites·17 claims
- 1139US2017191966A1Distributed circle method for guided wave based corrosion detection in plate-like structuresGEN ELECTRIC·Filed 2016·Application pending·0 cites
- 1238US9213019B2Method of determining a size of a defect using an ultrasonic linear phased arrayFALSETTI ROBERT VINCENT·Filed 2011·Granted Dec 15, 2015·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →