Inventor · disambiguated record
Robert J. Gleixner
Also filed as: GLEIXNER ROBERT · GLEIXNER ROBERT J · GLEIXNER ROBERT JOHN
23 granted patents·3 pending applications·53 citations·filing 2001–2024
93Inventor score
Top patents by PatentIndex Score
26 records- 0195US11456036B1Predicting and compensating for degradation of memory cellsMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 27, 2022·5 cites·23 claims
- 0280US11605418B2Memory device architecture using multiple physical cells per bit to improve read margin and to alleviate the need for managing demarcation read voltagesMICRON TECHNOLOGY INC·Filed 2020·Granted Mar 14, 2023·1 cites·19 claims
- 0380US11244717B2Write operation techniques for memory systemsMICRON TECHNOLOGY INC·Filed 2019·Granted Feb 8, 2022·4 cites·35 claims
- 0476US8036016B2Maintenance process to enhance memory enduranceMICRON TECHNOLOGY INC·Filed 2009·Granted Oct 11, 2011·14 cites·20 claims
- 0575US12020743B2Memory device architecture using multiple physical cells per bit to improve read margin and to alleviate the need for managing demarcation read voltagesMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 25, 2024·0 cites·19 claims
- 0673US2024339149A1Memory device architecture using multiple physical cells per bit to improve read margin and to alleviate the need for managing demarcation read voltagesMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 0772US7855103B2Wirebond structure and method to connect to a microelectronic dieINTEL CORP·Filed 2008·Granted Dec 21, 2010·4 cites·4 claims
- 0871US11868211B2Error detection and correction in memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Jan 9, 2024·0 cites·20 claims
- 0970US2025046373A1Triggering of stronger write pulses in a memory device based on prior read operationsMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 1069US11823745B2Predicting and compensating for degradation of memory cellsMICRON TECHNOLOGY INC·Filed 2022·Granted Nov 21, 2023·0 cites·20 claims
- 1167US11735258B2Increase of a sense current in memoryMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 22, 2023·0 cites·20 claims
- 1267US11705195B2Increase of a sense current in memoryMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 18, 2023·0 cites·20 claims
- 1367US6683383B2Wirebond structure and method to connect to a microelectronic dieINTEL CORP·Filed 2001·Granted Jan 27, 2004·11 cites·6 claims
- 1466US11710517B2Write operation techniques for memory systemsMICRON TECHNOLOGY INC·Filed 2022·Granted Jul 25, 2023·0 cites·20 claims
- 1566US7393772B2Wirebond structure and method to connect to a microelectronic dieINTEL CORP·Filed 2004·Granted Jul 1, 2008·10 cites·7 claims
- 1664US12131778B2Triggering of stronger write pulses in a memory device based on prior read operationsMICRON TECHNOLOGY INC·Filed 2022·Granted Oct 29, 2024·0 cites·27 claims
- 1763US11211122B1Increase of a sense current in memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 28, 2021·0 cites·24 claims
- 1862US11455210B1Error detection and correction in memoryMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 27, 2022·0 cites·23 claims
- 1962US11295811B2Increase of a sense current in memoryMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 5, 2022·0 cites·23 claims
- 2057US11711987B2Memory electrodes and formation thereofMICRON TECHNOLOGY INC·Filed 2020·Granted Jul 25, 2023·0 cites·10 claims
- 2153US6924554B2Wirebond structure and method to connect to a microelectronic dieINTEL CORP·Filed 2003·Granted Aug 2, 2005·4 cites·10 claims
- 2251US11568932B2Read cache for reset read disturb mitigationMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 31, 2023·0 cites·23 claims
- 2350US11823761B2Pre-read in opposite polarity to evaluate read marginMICRON TECHNOLOGY INC·Filed 2021·Granted Nov 21, 2023·0 cites·27 claims
- 2449US11651825B2Random value generatorMICRON TECHNOLOGY INC·Filed 2021·Granted May 16, 2023·0 cites·20 claims
- 2546US11978513B2Generating patterns for memory threshold voltage differenceMICRON TECHNOLOGY INC·Filed 2022·Granted May 7, 2024·0 cites·18 claims
- 2636US2009180313A1Chalcogenide anti-fuseDEWEERD WIM·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →