Inventor · disambiguated record
Ross A. Kohler
Also filed as: KOHLER ROSS · KOHLER ROSS A · KOHLER ROSS ALAN
25 granted patents·2 pending applications·482 citations·filing 1996–2013
96Inventor score
Top patents by PatentIndex Score
27 records- 0195US8516408B2Optimization of circuits having repeatable circuit instancesDELL RICHARD BRUCE·Filed 2009·Granted Aug 20, 2013·159 cites·30 claims
- 0292US6191980B1Single-poly non-volatile memory cell having low-capacitance erase gateLUCENT TECHNOLOGIES INC·Filed 2000·Granted Feb 20, 2001·76 cites·22 claims
- 0389US7254763B2Built-in self test for memory arrays using error correction codingAGERE SYSTEMS INC·Filed 2004·Granted Aug 7, 2007·68 cites·34 claims
- 0484US7872929B2Accessing memory cells in a memory circuitLSI CORP·Filed 2009·Granted Jan 18, 2011·16 cites·24 claims
- 0584US7746692B2Multiple-level memory with analog readAGERE SYSTEMS INC·Filed 2008·Granted Jun 29, 2010·15 cites·20 claims
- 0683US7742355B2Dynamic random access memory with low-power refreshAGERE SYSTEMS INC·Filed 2007·Granted Jun 22, 2010·14 cites·15 claims
- 0778US7002829B2Apparatus and method for programming a one-time programmable memory deviceAGERE SYSTEMS INC·Filed 2003·Granted Feb 21, 2006·24 cites·32 claims
- 0875US8566377B2Secure random number generatorHARRIS EDWARD B·Filed 2008·Granted Oct 22, 2013·10 cites·20 claims
- 0969US8405412B2Integrated circuit self-monitored burn-inKOHLER ROSS A·Filed 2009·Granted Mar 26, 2013·6 cites·18 claims
- 1068US8023348B2Method and apparatus for testing a memory deviceAGERE SYSTEMS INC·Filed 2007·Granted Sep 20, 2011·6 cites·23 claims
- 1166US8468419B2High-reliability memoryDUDECK DENNIS E·Filed 2009·Granted Jun 18, 2013·6 cites·20 claims
- 1266US6537867B1High speed low voltage semiconductor devices and method of fabricationAGERE SYSTEMS INC·Filed 2000·Granted Mar 25, 2003·12 cites·37 claims
- 1364US8139412B2Systematic error correction for multi-level flash memoryKOHLER ROSS A·Filed 2007·Granted Mar 20, 2012·5 cites·20 claims
- 1464US7930615B2Memory device with error correction capability and preemptive partial word write operationAGERE SYSTEMS INC·Filed 2007·Granted Apr 19, 2011·5 cites·22 claims
- 1560US8156402B2Memory device with error correction capability and efficient partial word write operationKOHLER ROSS A·Filed 2007·Granted Apr 10, 2012·4 cites·24 claims
- 1656US7551512B2Dual-port memoryAGERE SYSTEMS INC·Filed 2007·Granted Jun 23, 2009·3 cites·20 claims
- 1754US7764541B2Method and apparatus for hot carrier programmed one time programmable (OTP) memoryAGERE SYSTEMS INC·Filed 2004·Granted Jul 27, 2010·8 cites·19 claims
- 1853US7613061B2Method and apparatus for idle cycle refresh request in DRAMAGERE SYSTEMS INC·Filed 2007·Granted Nov 3, 2009·2 cites·18 claims
- 1952US6879509B2Read-only memory architectureAGERE SYSTEMS INC·Filed 2003·Granted Apr 12, 2005·5 cites·67 claims
- 2050US7940594B2Method and apparatus for increasing yield in a memory deviceAGERE SYSTEMS INC·Filed 2008·Granted May 10, 2011·2 cites·21 claims
- 2146US6151693AAutomated method of burn-in and endurance testing for embedded EEPROMLUCENT TECHNOLOGIES INC·Filed 1998·Granted Nov 21, 2000·11 cites·31 claims
- 2242US5857069ATechnique for recovering defective memoryLUCENT TECHNOLOGIES INC·Filed 1996·Granted Jan 5, 1999·14 cites·19 claims
- 2341US7085149B2Method and apparatus for reducing leakage current in a read only memory device using transistor biasAGERE SYSTEMS INC·Filed 2004·Granted Aug 1, 2006·2 cites·30 claims
- 2441US2013173944A1Reducing power consumption of memoryKOHLER ROSS·Filed 2011·Application pending·0 cites
- 2539US6380016B2Method for forming programmable CMOS ROM devicesFiled 1998·Granted Apr 30, 2002·6 cites·10 claims
- 2634US6219278B1Sense amplifier for memoryLUCENT TECHNOLOGIES INC·Filed 1999·Granted Apr 17, 2001·3 cites·22 claims
- 2733US2014169113A1Enhancing Memory Yield Through Memory Subsystem RepairLSI CORP·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →