Inventor · disambiguated record
Robert Lutwak
Also filed as: LUTWAK ROBERT · LUTWAK ROBERT IRA
8 granted patents·3 pending applications·70 citations·filing 2002–2025
83Inventor score
Files withMICROCHIP TECH INC7SYMMETRICOM INC2CHARLES STARK DRAPER LABORATORY INC1MICROSEMI FREQUENCY AND TIME CORP1
Top patents by PatentIndex Score
11 records- 0187US11764796B2Vapor cells and related systems and methodsMICROCHIP TECH INC·Filed 2022·Granted Sep 19, 2023·1 cites·23 claims
- 0286US10184796B2Chip-scale atomic gyroscopeMICROSEMI FREQUENCY AND TIME CORP·Filed 2014·Granted Jan 22, 2019·16 cites·20 claims
- 0383US2025337421A1Vapor cells and related systems and methodsMICROCHIP TECH INC·Filed 2025·Application pending·0 cites
- 0482US7064835B2Miniature gas cell with folded opticsSYMMETRICOM INC·Filed 2003·Granted Jun 20, 2006·24 cites·41 claims
- 0579US6605849B1MEMS analog frequency dividerSYMMETRICOM INC·Filed 2002·Granted Aug 12, 2003·28 cites·21 claims
- 0677US11750203B2Techniques for controlling vapor pressure of subject materials in vapor cells and related methodsMICROCHIP TECH INC·Filed 2021·Granted Sep 5, 2023·1 cites·23 claims
- 0773US12155395B2Techniques for controlling vapor pressure of subject materials in vapor cells and related methodsMICROCHIP TECH INC·Filed 2023·Granted Nov 26, 2024·0 cites·20 claims
- 0872US12395179B2Vapor cells and related systems and methodsMICROCHIP TECH INC·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 0966US11688995B2Grating emitter systems with controlled polarizationCHARLES STARK DRAPER LABORATORY INC·Filed 2020·Granted Jun 27, 2023·0 cites·20 claims
- 1057US2025298426A1Apparatus for controlling vapor pressure of a subject material contained therein, and related methods and systemsMICROCHIP TECH INC·Filed 2024·Application pending·0 cites
- 1150US2024413828A1Techniques for controlling vapor pressure of subject materials in vapor cells and related methodsMICROCHIP TECH INC·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →