Inventor · disambiguated record
Roland Mandl
Also filed as: MANDL ROLAND
9 granted patents·1 pending application·544 citations·filing 1990–2007
91Inventor score
Top patents by PatentIndex Score
10 records- 0197US5485082AMethod of calibrating a thickness measuring device and device for measuring or monitoring the thickness of layers, tapes, foils, and the likeMICRO EPSILON MESSTECHNIK·Filed 1990·Granted Jan 16, 1996·195 cites·12 claims
- 0292US6479990B2Eddy current sensor for analyzing a test object and method of operating sameMICRO EPSILON MESSTECHNIK·Filed 2001·Granted Nov 12, 2002·98 cites·32 claims
- 0382US5525903AEddy current method of acquiring the surface layer properties of a metallic targetMICRO EPSILON MESSTECHNIK·Filed 1994·Granted Jun 11, 1996·63 cites·13 claims
- 0482US5477473ASensor-drive and signal-processing methodMICRO EPSILON MESSTECHNIK·Filed 1993·Granted Dec 19, 1995·43 cites·18 claims
- 0580US6288536B1Eddy current sensorMICROEPSILON MESSTECHNIK GMBH·Filed 1997·Granted Sep 11, 2001·55 cites·17 claims
- 0668US6571133B1Method for process monitoring, control, and adjustmentMICRO EPSILON MESSTECHNIK·Filed 1998·Granted May 27, 2003·48 cites·15 claims
- 0768US5898304ASensor arrangement including a neural network and detection method using sameMICRO EPSILON MESSTECHNIK·Filed 1995·Granted Apr 27, 1999·25 cites·18 claims
- 0847US5606509ACorrection of a measuring signal obtained from a pair of scanning rollers and pertaining to the thickness of a textile fiber sliverRIETER INGOLSTADT SPINNEREI·Filed 1996·Granted Feb 25, 1997·14 cites·9 claims
- 0944US2007105238A1Method for processing values from a measurementMICRO EPSILON MESSTECHNIK·Filed 2007·Application pending·0 cites
- 1041US7150016B2Systems, methods and computer program products for controlling and visualizing processesMICRO EPSILON MESSTECHNIK·Filed 2001·Granted Dec 12, 2006·3 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →