Inventor · disambiguated record
Robert Muhr
Also filed as: MUHR ROBERT
2 granted patents·9 citations·filing 2018–2019
48Inventor score
Files withINFINEON TECHNOLOGIES AG2
Top patents by PatentIndex Score
2 records- 0181US10782242B2Inspection method for semiconductor substrates using slope data and inspection apparatusINFINEON TECHNOLOGIES AG·Filed 2018·Granted Sep 22, 2020·9 cites·22 claims
- 0249US11309196B2Detection of adhesive residue on a waferINFINEON TECHNOLOGIES AG·Filed 2019·Granted Apr 19, 2022·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →