Inventor · disambiguated record
Roland Pantel
Also filed as: PANTEL ROLAND
1 granted patent·1 pending application·3 citations·filing 1985–2004
22Inventor score
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2 records- 0125US2006288797A1Method for measuring physical parameters of at least one micrometric or nanometric dimensional phase in a composite systemROUVIERE JEAN-LUC·Filed 2004·Application pending·0 cites
- 0219US4643914AProcess and apparatus for the growth of films of silicides of refractory metals and films obtained by this processARNAUD DAVITAYA FRANCOIS·Filed 1985·Granted Feb 17, 1987·3 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →