Inventor · disambiguated record
Ronald J. Peiffer
Also filed as: PEIFFER RONALD J
12 granted patents·1 pending application·330 citations·filing 1987–2005
92Inventor score
Top patents by PatentIndex Score
13 records- 0198US5274336ACapacitively-coupled test probeHEWLETT PACKARD CO·Filed 1992·Granted Dec 28, 1993·210 cites·16 claims
- 0283US7061250B2Capacitive sensor measurement method for discrete time sampled system for in-circuit testAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jun 13, 2006·10 cites·12 claims
- 0382US7132834B2Capacitive sensor measurement method for discrete time sampled system for in-circuit testAGILENT TECHNOLOGIES INC·Filed 2005·Granted Nov 7, 2006·9 cites·14 claims
- 0475US5489851AIdentification of pin-open faults by measuring current or voltage change resulting from temperature changeHEWLETT PACKARD CO·Filed 1994·Granted Feb 6, 1996·36 cites·28 claims
- 0569US6998849B2Capacitive sensor measurement method for discrete time sampled system for in-circuit testAGILENT TECHNOLOGIES INC·Filed 2003·Granted Feb 14, 2006·11 cites·6 claims
- 0658US5392001ACapacitively-coupled amplifier with improved low frequency responseHEWLETT PACKARD CO·Filed 1994·Granted Feb 21, 1995·14 cites·10 claims
- 0755US7307222B2Printed circuit board test access point structures and method for making the sameAGILENT TECHNOLOGIES INC·Filed 2003·Granted Dec 11, 2007·6 cites·6 claims
- 0852US4801878AIn-circuit transistor beta test and methodHEWLETT PACKARD CO·Filed 1987·Granted Jan 31, 1989·12 cites·17 claims
- 0946US7411383B2Method and apparatus for discharging voltages from a circuit under testAGILENT TECHNOLOGIES INC·Filed 2005·Granted Aug 12, 2008·1 cites·24 claims
- 1046US5760596ATesting series passive components without contacting the driven nodeHEWLETT PACKARD CO·Filed 1997·Granted Jun 2, 1998·12 cites·7 claims
- 1138US5101152AIntegrated circuit transfer test device system utilizing lateral transistorsHEWLETT PACKARD CO·Filed 1990·Granted Mar 31, 1992·8 cites·12 claims
- 1236US7132876B2System for discharging electronic circuitryAGILENT TECHNOLOGIES INC·Filed 2004·Granted Nov 7, 2006·1 cites·20 claims
- 1332US2006139017A1Interface circuit for electronic test systemPEIFFER RONALD J·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →