Inventor · disambiguated record
Rodger Frank Schuttert
Also filed as: SCHUTTERT RODGER F · SCHUTTERT RODGER FRANK
11 granted patents·90 citations·filing 1996–2006
89Inventor score
Files withNXP BV4KONINKL PHILIPS ELECTRONICS NV3PHILIPS CORP2SCHUTTERT RODGER F1SCHUTTERT RODGER FRANK1
Top patents by PatentIndex Score
11 records- 0170US6664798B2Integrated circuit with test interfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2001·Granted Dec 16, 2003·17 cites·15 claims
- 0267US8169225B2System and method for on-chip jitter injectionSCHUTTERT RODGER FRANK·Filed 2005·Granted May 1, 2012·7 cites·19 claims
- 0365US7380186B2Boundary scan circuit with integrated sensor for sensing physical operating parametersNXP BV·Filed 2003·Granted May 27, 2008·12 cites·16 claims
- 0465US6812690B2Integrated circuit with power supply test interfaceKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Nov 2, 2004·12 cites·13 claims
- 0557US9838165B2Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontrollerSCHUTTERT RODGER F·Filed 2006·Granted Dec 5, 2017·3 cites·21 claims
- 0653US5781559ATestable circuitPHILIPS CORP·Filed 1996·Granted Jul 14, 1998·18 cites·15 claims
- 0750US6297643B2Connection test methodPHILIPS CORP·Filed 1999·Granted Oct 2, 2001·15 cites·11 claims
- 0849US7671618B2Analog IC having test arrangement and test method for such an ICNXP BV·Filed 2006·Granted Mar 2, 2010·1 cites·25 claims
- 0948US7447963B2Testing of electronic circuitsNXP BV·Filed 2004·Granted Nov 4, 2008·4 cites·27 claims
- 1040US6765403B2Test circuit and test method for protecting an IC against damage from activation of too many current drawing circuits at one timeKONINKL PHILIPS ELECTRONICS NV·Filed 2002·Granted Jul 20, 2004·1 cites·11 claims
- 1136US7685488B2Circuit interconnect testing arrangement and approach thereforNXP BV·Filed 2005·Granted Mar 23, 2010·0 cites·11 claims
Join the waitlist — get patent alerts
Get an alert when Rodger Frank Schuttert files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →