Inventor · disambiguated record
Rodney E. Schwartz
Also filed as: SCHWARTZ RODNEY · SCHWARTZ RODNEY E
10 granted patents·1 pending application·624 citations·filing 1987–2016
91Inventor score
Files withINTEGRATED TECHNOLOGY CORP5INTEGRATED TECH CORPORATION1ORMAN GARY M1SCHWARTZ RODNEY1SCHWARTZ RODNEY E1
Top patents by PatentIndex Score
11 records- 0192US6118894AIntegrated circuit probe card inspection systemFiled 1997·Granted Sep 12, 2000·145 cites·22 claims
- 0292US5657394AIntegrated circuit probe card inspection systemINTEGRATED TECHNOLOGY CORP·Filed 1993·Granted Aug 12, 1997·126 cites·13 claims
- 0392US4869497AComputer controlled exercise machineUNIVERSAL GYM EQUIPMENT INC·Filed 1987·Granted Sep 26, 1989·272 cites·19 claims
- 0479US7521947B2Probe needle protection method for high current probe testing of power devicesINTEGRATED TECHNOLOGY CORP·Filed 2007·Granted Apr 21, 2009·15 cites·24 claims
- 0568US9304147B2High current Kelvin connection and verification methodINTEGRATED TECHNOLOGY CORP·Filed 2014·Granted Apr 5, 2016·2 cites·22 claims
- 0662US4785674ATorque sensorORMAN GARY M·Filed 1987·Granted Nov 22, 1988·38 cites·18 claims
- 0756US5442276AApparatus for providing controlled mechanical braking torqueINTEGRATED TECHNOLOGY CORP·Filed 1993·Granted Aug 15, 1995·19 cites·21 claims
- 0841US5189360AMethod and apparatus for providing controlled mechanical braking torqueINTEGRATED TECHNOLOGY CORP·Filed 1989·Granted Feb 23, 1993·7 cites·15 claims
- 0935US9759763B2Damage reduction method and apparatus for destructive testing of power semiconductorsSCHWARTZ RODNEY E·Filed 2012·Granted Sep 12, 2017·0 cites·19 claims
- 1033US2011309847A1High Current Kelvin Connections and Contact Resistance Verification MethodSCHWARTZ RODNEY·Filed 2011·Application pending·0 cites
- 1132US10768206B2Loop-back probe test and verification methodINTEGRATED TECH CORPORATION·Filed 2016·Granted Sep 8, 2020·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →