Inventor · disambiguated record
Roland Stoehr
Also filed as: STOEHR ROLAND · STOEHR ROLAND R
9 granted patents·131 citations·filing 1988–1999
89Inventor score
Top patents by PatentIndex Score
9 records- 0178US4908571AContact probe assembly with fine positioning meansIBM·Filed 1988·Granted Mar 13, 1990·37 cites·5 claims
- 0266US6344751B1Finger tester probeATG TEST SYSTEMS GMBH·Filed 1999·Granted Feb 5, 2002·28 cites·26 claims
- 0348US5296091AMethod of etching substrates having a low thermal conductivityIBM·Filed 1991·Granted Mar 22, 1994·17 cites·6 claims
- 0445US6356089B2Contact probe arrangementIBM·Filed 1997·Granted Mar 12, 2002·11 cites·13 claims
- 0542US5488314ABuckling beam test probe assemblyIBM·Filed 1994·Granted Jan 30, 1996·13 cites·18 claims
- 0636US5532657AHigh speed coaxial contact and signal transmission elementIBM·Filed 1995·Granted Jul 2, 1996·11 cites·2 claims
- 0736US5304278AApparatus for plasma or reactive ion etching and method of etching substrates having a low thermal conductivityIBM·Filed 1992·Granted Apr 19, 1994·8 cites·9 claims
- 0832US5939893AContact probe arrangement for functional electrical testingIBM·Filed 1997·Granted Aug 17, 1999·4 cites·20 claims
- 0930US5863636AAdhesive bond for densely ordered elementsIBM·Filed 1997·Granted Jan 26, 1999·2 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →