Inventor · disambiguated record
Roland Stohr
Also filed as: STOEHR ROLAND · STOEHR ROLAND R
3 granted patents·165 citations·filing 1985–1992
77Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0183US4843315AContact probe arrangement for electrically connecting a test system to the contact pads of a device to be testedIBM·Filed 1988·Granted Jun 27, 1989·45 cites·10 claims
- 0282US5283107AModular multilayer interwiring structureIBM·Filed 1992·Granted Feb 1, 1994·89 cites·16 claims
- 0371US4686464ABuckling beam test probe assemblyIBM·Filed 1985·Granted Aug 11, 1987·31 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →