Inventor · disambiguated record
Ronald J. Syzdek
Also filed as: SYZDEK RONALD J
28 granted patents·1 pending application·155 citations·filing 1995–2019
96Inventor score
Files withFREESCALE SEMICONDUCTOR INC12TEXAS INSTRUMENTS INC6CUNNINGHAM JEFFREY C3AKHTER TAHMINA1HONG CHEONG M1
Top patents by PatentIndex Score
29 records- 0191US7865797B2Memory device with adjustable read reference based on ECC and method thereofFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Jan 4, 2011·26 cites·20 claims
- 0287US10825512B1Memory reads of weight valuesNXP USA INC·Filed 2019·Granted Nov 3, 2020·6 cites·20 claims
- 0384US9837161B2Split-gate memory having sector retirement with reduced current and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Dec 5, 2017·7 cites·20 claims
- 0480US8704587B2Configurable multistage charge pump using a supply detect schemeRAMANAN KARTHIK·Filed 2012·Granted Apr 22, 2014·9 cites·19 claims
- 0577US9111639B2Biasing split gate memory cell during power-off modeHONG CHEONG MIN·Filed 2013·Granted Aug 18, 2015·6 cites·19 claims
- 0676US7564716B2Memory device with retained indicator of read reference levelFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Jul 21, 2009·10 cites·21 claims
- 0774US7545679B1Electrical erasable programmable memory transconductance testingFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Jun 9, 2009·9 cites·20 claims
- 0866US7782664B2Method for electrically trimming an NVM reference cellFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Aug 24, 2010·6 cites·18 claims
- 0965US9218889B1Multibit sense amplifier calibrationAKHTER TAHMINA·Filed 2014·Granted Dec 22, 2015·4 cites·20 claims
- 1065US6615391B2Current controlled multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 2002·Granted Sep 2, 2003·9 cites·7 claims
- 1164US8885403B2Programming a split gate bit cellHONG CHEONG M·Filed 2013·Granted Nov 11, 2014·3 cites·20 claims
- 1263US7649781B2Bit cell reference device and methods thereofFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Jan 19, 2010·5 cites·20 claims
- 1362US7742340B2Read reference technique with current degradation protectionFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Jun 22, 2010·5 cites·20 claims
- 1462US7624329B2Programming a memory device having error correction logicFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Nov 24, 2009·5 cites·20 claims
- 1561US9013927B1Sector-based regulation of program voltages for non-volatile memory (NVM) systemsCUNNINGHAM JEFFREY C·Filed 2013·Granted Apr 21, 2015·2 cites·20 claims
- 1660US7259999B2Non-volatile memory cell array for improved data retention and method of operating thereofFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Aug 21, 2007·4 cites·20 claims
- 1758US8310877B2Read conditions for a non-volatile memory (NVM)CUNNINGHAM JEFFREY C·Filed 2011·Granted Nov 13, 2012·2 cites·20 claims
- 1852US7843730B2Non-volatile memory with reduced charge fluenceFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Nov 30, 2010·2 cites·20 claims
- 1952US7668018B2Electronic device including a nonvolatile memory array and methods of using the sameFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Feb 23, 2010·2 cites·20 claims
- 2051US9111629B2Smart charge pump configuration for non-volatile memoriesCUNNINGHAM JEFFREY C·Filed 2012·Granted Aug 18, 2015·1 cites·17 claims
- 2150US5694073ATemperature and supply-voltage sensing circuitTEXAS INSTRUMENTS INC·Filed 1995·Granted Dec 2, 1997·12 cites·21 claims
- 2245US8971147B2Control gate word line driver circuit for multigate memoryMULLER GILLES·Filed 2012·Granted Mar 3, 2015·1 cites·18 claims
- 2342US2013346680A1Emulated electrically erasable memory having an address ram for data stored in flash memorySCOULLER ROSS S·Filed 2012·Application pending·0 cites
- 2437US5668769AMemory device performance by delayed power-downTEXAS INSTRUMENTS INC·Filed 1995·Granted Sep 16, 1997·6 cites·5 claims
- 2536US5646894ASmart boost circuit for low voltage flash EPROMTEXAS INSTRUMENTS INC·Filed 1995·Granted Jul 8, 1997·5 cites·16 claims
- 2634US9685339B2Scalable split gate memory cell arrayYATER JANE A·Filed 2013·Granted Jun 20, 2017·0 cites·20 claims
- 2733US9536614B2Common source architecture for split gate memoryFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Jan 3, 2017·0 cites·20 claims
- 2832US6408411B1Two pass multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Jun 18, 2002·4 cites·6 claims
- 2932US6381718B1Current controlled multi-state parallel test for semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 30, 2002·4 cites·7 claims
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