Inventor · disambiguated record

Roy P. Tan

Also filed as: TAN ROY P · TAN ROY PATRICK

2 granted patents·4 citations·filing 2009–2010

40Inventor score

Technology areasG06F

Files withBURCKHARDT SEBASTIAN C1 DERN CHRISTOPHER WILLIAM1

Top patents by PatentIndex Score

2 records

0152US8276021B2Concurrency test effectiveness via mutation testing and dynamic lock elisionDERN CHRISTOPHER WILLIAM·Filed 2009·Granted Sep 25, 2012·4 cites·20 claims
0232US8433954B2Testing components for thread safetyBURCKHARDT SEBASTIAN C·Filed 2010·Granted Apr 30, 2013·0 cites·20 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →