Inventor · disambiguated record

Rolf Von Criegern

Also filed as: VON CRIEGERN ROLF

3 granted patents·8 citations·filing 1982–1988

57Inventor score

Technology areasH01J

Files withSIEMENS AG3

Top patents by PatentIndex Score

3 records

0146US4465935AElectrically conductive sample support-mounting for secondary ion mass spectrometer analysisSIEMENS AG·Filed 1982·Granted Aug 14, 1984·7 cites·11 claims
0226US4851672ASpecimen mount for secondary ion mass spectrometry and other sensitive particle beam analysis methods and method for the operation thereofSIEMENS AG·Filed 1984·Granted Jul 25, 1989·1 cites·11 claims
0320US4860225AMethod and apparatus for storing measured data from sub-regions of a sputter crater which is generated and analyzed in a secondary ion mass spectrometerSIEMENS AG·Filed 1988·Granted Aug 22, 1989·0 cites·19 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →