Inventor · disambiguated record
Rudiger Schmolke
Also filed as: SCHMOLKE RUDIGER · SCHMOLKE RUEDIGER
6 granted patents·2 pending applications·133 citations·filing 1998–2006
85Inventor score
Top patents by PatentIndex Score
8 records- 0188US6228164B1Process for producing a single crystalWACKER SILTRONIC HALBLEITERMAT·Filed 1999·Granted May 8, 2001·67 cites·26 claims
- 0278US6630024B2Method for the production of an epitaxially grown semiconductor waferWACKER SILTRONIC HALBLEITERMAT·Filed 2001·Granted Oct 7, 2003·19 cites·25 claims
- 0377US7052948B2Film or layer made of semi-conductive material and method for producing said film or layerSILTRONIC AG·Filed 2002·Granted May 30, 2006·23 cites·39 claims
- 0475US7417297B2Film or layer of semiconducting material, and process for producing the film or layerSILTRONIC AG·Filed 2006·Granted Aug 26, 2008·6 cites·10 claims
- 0573US6843848B2Semiconductor wafer made from silicon and method for producing the semiconductor waferSILTRONIC AG·Filed 2001·Granted Jan 18, 2005·13 cites·4 claims
- 0636US2004144977A1Semiconductor wafer with a thin epitaxial silicon layer, and production processWACKER SILTRONIC HALBLEITERMAT·Filed 2004·Application pending·0 cites
- 0729US2001041258A1Standard for a nanotopography unit, and a method for producing the standardWACKER SILTRONIC HALBLEITERMAT·Filed 2001·Application pending·0 cites
- 0824US6333785B1Standard for calibrating and checking a surface inspection device and method for the production thereofWACKER SILTRONIC GES F &UE·Filed 1998·Granted Dec 25, 2001·5 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →