Inventor · disambiguated record
Ruslan Temirov
Also filed as: TEMIROV RUSLAN
3 granted patents·0 citations·filing 2008–2016
40Inventor score
Technology areasG01Q
Top patents by PatentIndex Score
3 records- 0136US10585116B2Scanning probe microscope and method for measuring local electrical potential fieldsFORSCHUNGSZENTRUM JUELICH GMBH·Filed 2016·Granted Mar 10, 2020·0 cites·32 claims
- 0233US8347410B2Method for examining a sampleFORSCHUNGSZENTRUM JUELICH GMBH·Filed 2008·Granted Jan 1, 2013·0 cites·8 claims
- 0330US8832860B2Method for measuring the force interaction that is caused by a sampleTEMIROV RUSLAN·Filed 2010·Granted Sep 9, 2014·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →