Inventor · disambiguated record
Ruiqi Tian
Also filed as: TIAN RUIQI
18 granted patents·326 citations·filing 1999–2011
94Inventor score
Top patents by PatentIndex Score
18 records- 0192US6611045B2Method of forming an integrated circuit device using dummy features and structure thereofMOTOROLA INC·Filed 2001·Granted Aug 26, 2003·80 cites·16 claims
- 0291US7276435B1Die level metal density gradient for improved flip chip package reliabilityFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Oct 2, 2007·27 cites·20 claims
- 0386US6396158B1Semiconductor device and a process for designing a maskMOTOROLA INC·Filed 1999·Granted May 28, 2002·81 cites·23 claims
- 0484US6905967B1Method for improving planarity of shallow trench isolation using multiple simultaneous tiling systemsMOTOROLA INC·Filed 2003·Granted Jun 14, 2005·41 cites·32 claims
- 0584US6593226B2Method for adding features to a design layout and process for designing a maskMOTOROLA INC·Filed 2001·Granted Jul 15, 2003·34 cites·35 claims
- 0678US7741221B2Method of forming a semiconductor device having dummy featuresFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Jun 22, 2010·6 cites·19 claims
- 0776US7322014B2Method of implementing polishing uniformity and modifying layout dataFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Jan 22, 2008·5 cites·12 claims
- 0874US7470624B2Integrated assist features for epitaxial growth bulk/SOI hybrid tiles with compensationFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Dec 30, 2008·4 cites·20 claims
- 0973US7951695B2Method for reducing plasma discharge damage during processingFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted May 31, 2011·4 cites·18 claims
- 1068US7785983B2Semiconductor device having tiles for dual-trench integration and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Aug 31, 2010·4 cites·12 claims
- 1166US7146593B2Method of implementing polishing uniformity and modifying layout dataFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Dec 5, 2006·10 cites·20 claims
- 1263US8003539B2Integrated assist features for epitaxial growthFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Aug 23, 2011·1 cites·22 claims
- 1361US6489083B1Selective sizing of features to compensate for resist thickness variations in semiconductor devicesMOTOROLA INC·Filed 2000·Granted Dec 3, 2002·8 cites·21 claims
- 1457US6459156B1Semiconductor device, a process for a semiconductor device, and a process for making a masking databaseMOTOROLA INC·Filed 1999·Granted Oct 1, 2002·21 cites·45 claims
- 1548US8343842B2Method for reducing plasma discharge damage during processingFREESCALE SEMICONDUCTOR INC·Filed 2011·Granted Jan 1, 2013·0 cites·6 claims
- 1647US8722519B2Integrated assist features for epitaxial growthZIA OMAR·Filed 2011·Granted May 13, 2014·0 cites·17 claims
- 1747US7565639B2Integrated assist features for epitaxial growth bulk tiles with compensationFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Jul 21, 2009·0 cites·20 claims
- 1841US8741743B2Integrated assist features for epitaxial growthZIA OMAR·Filed 2007·Granted Jun 3, 2014·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →