Inventor · disambiguated record
Ryoichi Fukasawa
Also filed as: FUKASAWA RYOICHI
4 granted patents·2 pending applications·31 citations·filing 1993–2013
69Inventor score
Top patents by PatentIndex Score
6 records- 0170US6661519B2Semiconductor impurity concentration testing apparatus and semiconductor impurity concentration testing methodTOCHIGI NIKON CORP·Filed 2001·Granted Dec 9, 2003·16 cites·4 claims
- 0250US5371596AOptical apparatus components having spectrally overlapping characteristics for measuring semiconductor layer thicknessJASCO CORP·Filed 1993·Granted Dec 6, 1994·15 cites·10 claims
- 0345US9063078B2Method and apparatus for measuring characteristics of objectKONDO TAKASHI·Filed 2012·Granted Jun 23, 2015·0 cites·20 claims
- 0437US10054685B2Foreign-matter detecting apparatus and method for detecting foreign-matter in powder using terahertz pulse waveNIPRO CORP·Filed 2013·Granted Aug 21, 2018·0 cites·10 claims
- 0532US2001026859A1Functional films, their use, articles having the films and processes for producing theseFiled 2000·Application pending·0 cites
- 0627US2001029436A1Semiconductor electrical characteristics evaluation apparatus and semiconductor electrical characteristics evaluation methodTOCHIGI NIKON CORP NIKON CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →