Inventor · disambiguated record
Ryohei Kanno
Also filed as: KANNO RYOHEI
10 granted patents·4 pending applications·33 citations·filing 2016–2022
85Inventor score
Top patents by PatentIndex Score
14 records- 0177US10895449B2Shape measuring deviceMITUTOYO CORP·Filed 2019·Granted Jan 19, 2021·1 cites·5 claims
- 0275USD783424SImage measuring deviceMITUTOYO CORP·Filed 2016·Granted Apr 11, 2017·16 cites·1 claims
- 0369USD986075SImage measuring deviceMITUTOYO CORP·Filed 2021·Granted May 16, 2023·4 cites·1 claims
- 0467US12191372B2Crystal, semiconductor element and semiconductor deviceFLOSFIA INC·Filed 2022·Granted Jan 7, 2025·0 cites·19 claims
- 0558US12107125B2Oxide semiconductor film and semiconductor deviceFLOSFIA INC·Filed 2022·Granted Oct 1, 2024·0 cites·12 claims
- 0658USD1001657SImage measuring deviceMITUTOYO CORP·Filed 2021·Granted Oct 17, 2023·2 cites·1 claims
- 0755US2021217869A1Crystal, semiconductor element and semiconductor deviceFLOSFIA INC·Filed 2021·Application pending·0 cites
- 0850USD806585SImage measuring deviceMITUTOYO CORP·Filed 2016·Granted Jan 2, 2018·5 cites·1 claims
- 0949US2022310798A1Electrically-conductive metal oxide film, semiconductor element and semiconductor deviceFLOSFIA INC·Filed 2022·Application pending·0 cites
- 1049US2022140084A1Oxide film and semiconductor deviceFLOSFIA INC·Filed 2022·Application pending·0 cites
- 1148USD981879SImage measuring deviceMITUTOYO CORP·Filed 2021·Granted Mar 28, 2023·1 cites·1 claims
- 1246USD806586SImage measuring deviceMITUTOYO CORP·Filed 2016·Granted Jan 2, 2018·4 cites·1 claims
- 1345US10197374B2Measuring apparatusMITUTOYO CORP·Filed 2016·Granted Feb 5, 2019·0 cites·6 claims
- 1443US2021217854A1Semiconductor element and semiconductor deviceFLOSFIA INC·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →