Inventor · disambiguated record
Ryohei Kokawa
Also filed as: KOKAWA RYOHEI
4 granted patents·57 citations·filing 1991–2014
73Inventor score
Top patents by PatentIndex Score
4 records- 0174US5200616AEnvironment controllable scanning probe microscopeSHIMADZU CORP·Filed 1991·Granted Apr 6, 1993·37 cites·11 claims
- 0247US6532805B1Micro-material testing apparatusTADA NAOYA·Filed 1999·Granted Mar 18, 2003·18 cites·5 claims
- 0341US10620235B2Cantilever attachment fitting and scanning probe microscope provided therewithSHIMADZU CORP·Filed 2014·Granted Apr 14, 2020·0 cites·4 claims
- 0429US6137115AFilm inspecting apparatusSHIMADZU CORP·Filed 1999·Granted Oct 24, 2000·2 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →