Inventor · disambiguated record

Ryou Nakagaki

Also filed as: NAKAGAKI RYOU

1 granted patent·1 pending application·29 citations·filing 1999–2001

44Inventor score

Technology areasG01N H10P

Files withHITACHI LTD1

Top patents by PatentIndex Score

2 records

0162US6756589B1Method for observing specimen and device thereforHITACHI LTD·Filed 1999·Granted Jun 29, 2004·29 cites·10 claims
0239US2001042705A1Method for classifying defects and device for the sameFiled 2001·Application pending·0 cites

Join the waitlist — get patent alerts

Get an alert when Ryou Nakagaki files or is granted a new patent.

We store only your email — no account needed. See our privacy policy.

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →