Inventor · disambiguated record
Ryota Nihei
Also filed as: NIHEI RYOTA
3 granted patents·16 pending applications·0 citations·filing 2014–2024
39Inventor score
Top patents by PatentIndex Score
19 records- 0169US12293033B2Display antennaNEC CORP·Filed 2023·Granted May 6, 2025·0 cites·10 claims
- 0256US12453095B2Semiconductor storage deviceKIOXIA CORP·Filed 2023·Granted Oct 21, 2025·0 cites·20 claims
- 0356US2025260162A1Phase shifter and antenna deviceNEC CORP·Filed 2024·Application pending·0 cites
- 0456US2025260149A1Phase shifter and antenna deviceNEC CORP·Filed 2024·Application pending·0 cites
- 0555US2024380096A1Display antennaNEC CORP·Filed 2024·Application pending·0 cites
- 0654US12249768B2Antenna device and display antennaNEC CORP·Filed 2023·Granted Mar 11, 2025·0 cites·9 claims
- 0753US2025260150A1Phase shifter and antenna deviceNEC CORP·Filed 2024·Application pending·0 cites
- 0849US2024090239A1Semiconductor device and method for manufacturing the sameKIOXIA CORP·Filed 2023·Application pending·0 cites
- 0948US2025202538A1Control device, control method, and non-transitory computer-readable mediumNEC CORP·Filed 2022·Application pending·0 cites
- 1046US2025373221A1Phase shifter and antenna deviceNEC CORP·Filed 2022·Application pending·0 cites
- 1146US2025364711A1Phase shifter and antenna deviceNEC CORP·Filed 2022·Application pending·0 cites
- 1245US2025158649A1Radio wave control system, control apparatus, control method, and non-transitory computer readable mediumNEC CORP·Filed 2022·Application pending·0 cites
- 1345US2025175241A1Control apparatus, terminal apparatus, control method, and non-transitory computer-readable mediumNEC CORP·Filed 2022·Application pending·0 cites
- 1445US2025062786A1Transmitter/receiver, transmission/reception device, and transmission/reception methodNEC CORP·Filed 2022·Application pending·0 cites
- 1543US2025202109A1Radio wave control system, control apparatus, radio wave control method, and non-transitory computer readable mediumNEC CORP·Filed 2022·Application pending·0 cites
- 1640US2015076702A1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1730US2015060859A1Evaluation sample, method of obtaining etching yield function and simulation methodTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1825US2017068757A1Simulation device for semiconductor device, and short-circuit determination method for semiconductor deviceTOSHIBA KK·Filed 2016·Application pending·0 cites
- 1923US2017018564A1Semiconductor memory device and method for manufacturing sameTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →